SEMICONDUCTOR INTEGRATED CIRCUITS

A prediction technique for single-event effects on complex integrated circuits

Yuanfu Zhao1, Chunqing Yu1, , Long Fan1, Suge Yue1, 2, Maoxin Chen1, Shougang Du1 and Hongchao Zheng1

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 Corresponding author: Yu Chunqing, Email: yuchunqing2006@163.com

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Abstract: The sensitivity of complex integrated circuits to single-event effects is investigated. Sensitivity depends not only on the cross section of physical modules but also on the behavior of data patterns running on the system. A method dividing the main functional modules is proposed. The intrinsic cross section and the duty cycles of different sensitive modules are obtained during the execution of data patterns. A method for extracting the duty cycle is presented and a set of test patterns with different duty cycles are implemented experimentally. By combining the intrinsic cross section and the duty cycle of different sensitive modules, a universal method to predict SEE sensitivities of different test patterns is proposed, which is verified by experiments based on the target circuit of a microprocessor. Experimental results show that the deviation between prediction and experiment is less than 20%.

Key words: complex ICsduty cycleprediction of cross sectionprediction techniques



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Fig. 1.  Flowchart of error rate prediction.

Fig. 2.  Architecture of the microprocessor.

Fig. 3.  Flowchart of duty cycle calculation.

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Table 1.   Comparison between prediction results and test results.

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Table 2.   Comparison between prediction results and test results under full functional test mode.

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Table 3.   Comparison of error rate between test results and prediction results.

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    Received: 11 June 2015 Revised: Online: Published: 01 November 2015

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      Yuanfu Zhao, Chunqing Yu, Long Fan, Suge Yue, Maoxin Chen, Shougang Du, Hongchao Zheng. A prediction technique for single-event effects on complex integrated circuits[J]. Journal of Semiconductors, 2015, 36(11): 115003. doi: 10.1088/1674-4926/36/11/115003 Y F Zhao, C Q Yu, L Fan, S G Yue, M X Chen, S G Du, H C Zheng. A prediction technique for single-event effects on complex integrated circuits[J]. J. Semicond., 2015, 36(11): 115003. doi: 10.1088/1674-4926/36/11/115003.Export: BibTex EndNote
      Citation:
      Yuanfu Zhao, Chunqing Yu, Long Fan, Suge Yue, Maoxin Chen, Shougang Du, Hongchao Zheng. A prediction technique for single-event effects on complex integrated circuits[J]. Journal of Semiconductors, 2015, 36(11): 115003. doi: 10.1088/1674-4926/36/11/115003

      Y F Zhao, C Q Yu, L Fan, S G Yue, M X Chen, S G Du, H C Zheng. A prediction technique for single-event effects on complex integrated circuits[J]. J. Semicond., 2015, 36(11): 115003. doi: 10.1088/1674-4926/36/11/115003.
      Export: BibTex EndNote

      A prediction technique for single-event effects on complex integrated circuits

      doi: 10.1088/1674-4926/36/11/115003
      More Information
      • Corresponding author: Yu Chunqing, Email: yuchunqing2006@163.com
      • Received Date: 2015-06-11
      • Accepted Date: 2015-07-23
      • Published Date: 2015-01-25

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