Chin. J. Semicond. > 2006, Volume 27 > Issue S1 > 186-188

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Fabrication of Surface Nanostructures Using Scanning Electron Microscope

Zhu Nianlin, Zhang Jin, Chen Ergang, Bai Han, Zhang Xi, Wang Guangcan, Guo Junmei and Dou Juying

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Abstract: We present a new method to fabricate PMMA 1D and 2D periodic nanostructures at the tens-to-hundreds of nanometers scale using the calibrating sign of a digital scanning electron microscope (SEM).In our work,a controllable negative bias voltage generator is cascaded into the cathode self-bias-voltage circuits of SEM,and its internal resistance is far smaller than the self-bias-voltage resistance.The SEM works normally when the generator do not produce negative bias voltage.Once the negative bias voltage is generated,it will restrain electrons emitted from the cathode not passed the grid.The resulting patterning of PMMA-1D and 2D periodic nanostructures are formed by electron beam scanning in the modified SEM.

Key words: digital SEMnegative bias voltage generatorsurface nanostructure arraye-beam lithography

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    Received: 20 August 2015 Revised: Online: Published: 01 December 2006

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      Zhu Nianlin, Zhang Jin, Chen Ergang, Bai Han, Zhang Xi, Wang Guangcan, Guo Junmei, Dou Juying. Fabrication of Surface Nanostructures Using Scanning Electron Microscope[J]. Journal of Semiconductors, 2006, In Press. Zhu N L, Zhang J, Chen E G, Bai H, Zhang X, Wang G C, Guo J M, Dou J Y. Fabrication of Surface Nanostructures Using Scanning Electron Microscope[J]. Chin. J. Semicond., 2006, 27(13): 186.Export: BibTex EndNote
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      Zhu Nianlin, Zhang Jin, Chen Ergang, Bai Han, Zhang Xi, Wang Guangcan, Guo Junmei, Dou Juying. Fabrication of Surface Nanostructures Using Scanning Electron Microscope[J]. Journal of Semiconductors, 2006, In Press.

      Zhu N L, Zhang J, Chen E G, Bai H, Zhang X, Wang G C, Guo J M, Dou J Y. Fabrication of Surface Nanostructures Using Scanning Electron Microscope[J]. Chin. J. Semicond., 2006, 27(13): 186.
      Export: BibTex EndNote

      Fabrication of Surface Nanostructures Using Scanning Electron Microscope

      • Received Date: 2015-08-20

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