Chin. J. Semicond. > 2002, Volume 23 > Issue 9 > 914-920

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Abstract:

By using LPCVD SiO2 and poly silicon as sacrificial layer and cantilever respectively, a poly silicon micromachined RF MEMS (radio frequency microelectronic mechanical system) switch is fabricated. During the fabrication process, the stress of poly-silicon is released to prevent poly-silicon membrane from bending, and the issue of compatibility between RF switch and IC process technology is also resolved. The low residual tensile stress poly-silicon cantilever is obtained by the optimization. The switch is tested, and the preliminary test results show: the pull down voltage is 89 V, and the switch speed is about 5 μs. The switch provides the potential to build a new fully monolithic integrated RF MEMS for radar and communications applications.

Key words: poly-silicon micromachined switchcantileversacrificial layerrestoring force

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    History

    Received: 17 January 2002 Revised: Online: Published: 01 September 2002

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      ZHANG Zheng-yuan, WEN Zhi-yu, XU Shi-liu, ZHANG Zheng-fan, LI Kai-cheng, HUANG Shang-lian. Poly-Silicon Micromachined Switch[J]. Journal of Semiconductors, 2002, In Press. . Poly-Silicon Micromachined Switch[J]. J. Semicond, 2002, In Press. Export: BibTex EndNote
      Citation:
      ZHANG Zheng-yuan, WEN Zhi-yu, XU Shi-liu, ZHANG Zheng-fan, LI Kai-cheng, HUANG Shang-lian. Poly-Silicon Micromachined Switch[J]. Journal of Semiconductors, 2002, In Press.

      . Poly-Silicon Micromachined Switch[J]. J. Semicond, 2002, In Press.
      Export: BibTex EndNote

      Poly-Silicon Micromachined Switch

      • Received Date: 2002-01-17
        Available Online: 2023-03-15
      • Published Date: 2002-09-01

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