Chin. J. Semicond. > 2005, Volume 26 > Issue 1 > 57-61

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Abstract: 用磁控溅射系统和快速合金化法制备了Mo/W/Ti/Au多层金属和n-GaAs材料的欧姆接触,在溅射金属层之前分别用HCl溶液和(NH4)2S溶液对n-GaAs材料的表面进行处理.用传输线法对比接触电阻进行了测试,并利用俄歇电子能谱(AES)、X射线衍射图谱(XRD)对接触的微观结构进行了分析.结果表明,用(NH4)2S溶液对n-GaAs材料表面进行处理后,比接触电阻最小;在700℃快速合金化后获得最低的比接触电阻,约为4.5×10-6Ω·cm2.这是由于(NH4)2S溶液钝化处理后降低了GaAs的表面态密度,消除了费米能级钉扎效应,从而改善了难熔金属与GaAs的接触特性.

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    Received: 19 August 2015 Revised: Online: Published: 01 January 2005

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      难熔金属与n-GaAs的欧姆接触特性[J]. Journal of Semiconductors, 2005, In Press. 难熔金属与n-GaAs的欧姆接触特性[J]. Chin. J. Semicond., 2005, 26(1): 57.Export: BibTex EndNote
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      难熔金属与n-GaAs的欧姆接触特性[J]. Journal of Semiconductors, 2005, In Press.

      难熔金属与n-GaAs的欧姆接触特性[J]. Chin. J. Semicond., 2005, 26(1): 57.
      Export: BibTex EndNote

      难熔金属与n-GaAs的欧姆接触特性

      • Received Date: 2015-08-19

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