Chin. J. Semicond. > 2005, Volume 26 > Issue 10 > 1959-1962
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拓扑缺陷对碳纳米管电学性能的影响

张丽芳 and 胡慧芳

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Key words: 碳纳米管, 分子结, 异质结, 拓扑缺陷, 电荷密度

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    Received: 19 August 2015 Revised: Online: Published: 01 October 2005

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      Article Navigation >  Journal of Semiconductors  > 2005  >  26(10): 1959-1962
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      • Received Date: 2015-08-19

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