J. Semicond. > Volume 35 > Issue 5 > Article Number: 055008

A high speed low power low offset dynamic comparator used in SHA-less pipelined ADC

Shubin Liu , Zhangming Zhu , , Yintang Yang and Lianxi Liu

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Abstract: A novel fully differential high speed high resolution low offset CMOS dynamic comparator has been implemented in the SMIC 0.18 μm process used for a sample-and-hold amplifier (SHA)-less pipelined analog-to-digital converters (ADC). Based on the analysis and optimization between delay time and offset, an enhanced reset architecture with transmission gate was introduced to speed up the comparison and reset procedure. Four inputs with two cross coupled differential pairs, reconstituted bias circuit for tail current transistor and common centroid layouts make the comparator more robust against mismatch and process variations. The simulation results demonstrate that the proposed design achieves 1 mV sensitivity at 2.2 GHz sampling rate with a power consumption of 510 μW, while the mean offset voltage is equal to 10.244 mV.

Key words: SHA-less ADCdynamic comparatorhigh speedlow offsetlow powertransmission gate

Abstract: A novel fully differential high speed high resolution low offset CMOS dynamic comparator has been implemented in the SMIC 0.18 μm process used for a sample-and-hold amplifier (SHA)-less pipelined analog-to-digital converters (ADC). Based on the analysis and optimization between delay time and offset, an enhanced reset architecture with transmission gate was introduced to speed up the comparison and reset procedure. Four inputs with two cross coupled differential pairs, reconstituted bias circuit for tail current transistor and common centroid layouts make the comparator more robust against mismatch and process variations. The simulation results demonstrate that the proposed design achieves 1 mV sensitivity at 2.2 GHz sampling rate with a power consumption of 510 μW, while the mean offset voltage is equal to 10.244 mV.

Key words: SHA-less ADCdynamic comparatorhigh speedlow offsetlow powertransmission gate



References:

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Yu L, Doris K, Hegt H. A dynamic latched comparator for low supply voltages down to 0.45 V in 65-nm COMS[J]. IEEE International Symposium on Circuits and Systems (ISCAS), 2012: 2737.

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Moni D J, Jisha P. High-speed and low-power dynamic latch comparator[J]. International Conference on Devices, Circuits and Systems (ICDCS), 2012: 259.

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Jeon H J, Kim Y B. A novel low-power, low-offset, and highspeed CMOS dynamic latched comparator[J]. Analog Integr Circ Sig Process, 2011, 70: 337.

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Murmann B, Nikaeen P, Connelly D J. Impact of scaling on analog performance and associated modeling needs[J]. IEEE Trans Electron Devices, 2006, 53: 2160. doi: 10.1109/TED.2006.880372

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Lin T, Wang M S, Gu W R. A wide-range and high-precision real-time calibration for dynamic comparator[J]. IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2012: 1.

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Sumanen L, Waltari M, Halonen K. A mismatch insensitive CMOS dynamic comparator for pipeline A/D converters[J]. IEEE International Conference on Electronics, Circuits and Systems (IECS), 2000, 1: 32.

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Cho T B, Gray P R. A 10 b, 20 Msample/s, 35 mW pipeline A/D converter[J]. IEEE J Solid-State Circuits, 1995, SC-30: 166.

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Wicht B, Nirschl T, Schmitt-Landsiedel D. Yield and speed optimization of a latch-type voltage sense amplifier[J]. IEEE J Solid-State Circuits, 2004, 39: 1148. doi: 10.1109/JSSC.2004.829399

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He J, Zhan S, Chen D. Analyses of static and dynamic random offset voltages in dynamic comparators[J]. IEEE International Symposium on Circuits and Systems, 2009, 56: 911.

[15]

Nikoozadeh A, Murmann B. An analysis of latch comparator offset due to load capacitor mismatch[J]. IEEE Trans Circuits Syst Ⅱ:Express Briefs, 2006, 53: 1398. doi: 10.1109/TCSII.2006.883204

[16]

Bichan M, Carusone A C. The effect of redundancy on mismatch-induced offset and random noise in a dynamic comparator[J]. Research in Microelectronics and Electronics, 2009: 180.

[17]

Kinget P R. Device mismatch and tradeoffs in the design of analog circuits[J]. IEEE J Solid-State Circuits, 2005, 40: 1212. doi: 10.1109/JSSC.2005.848021

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Savengsveksa V, Heedley P L, Matthews T. An 8-b 20 Msample/s pipelined A/D converter in 0.5μm CMOS with 7.8 ENOB[J]. IEEE MWSCAS, 2005: 409.

[19]

Kim J, Leibowitz B, Ren J. Simulation and analysis of random decision errors in clocked comparators[J]. IEEE Trans Circuits Syst I, Reg Papers, 2009, 56: 1844. doi: 10.1109/TCSI.2009.2028449

[1]

Li Z. A high-speed comparator for a 12-bit 100 MS/s pipelined ADC[J]. International Conference on Intelligent Computation Technology and Automation (ICICTA), Huhehaote, China, 2011: 27.

[2]

Khosrov D S. A new offset cancelled latch comparator for high-speed, low-power ADCs, APCCAS. IEEE Asia Pacific Conference on Circuits and Systems, Kuala Lumpur, Malaysia, 2010

[3]

Ye X, Ytterdal T. A low-offset dynamic comparator using bulk biasing technique in digital 65 nm CMOS technology. 10th IEEE International Conference on Solid-State and Integrated Circuit, ICSICT, Shanghai, China, 2010

[4]

Solis C J, Ducoudray G O. High resolution low power 0.6μm CMOS 40 MHz dynamic latch comparator. 53rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)[J]. Washington, USA, 2010: 1045.

[5]

Yu L, Doris K, Hegt H. A dynamic latched comparator for low supply voltages down to 0.45 V in 65-nm COMS[J]. IEEE International Symposium on Circuits and Systems (ISCAS), 2012: 2737.

[6]

Moni D J, Jisha P. High-speed and low-power dynamic latch comparator[J]. International Conference on Devices, Circuits and Systems (ICDCS), 2012: 259.

[7]

Jeon H J, Kim Y B. A novel low-power, low-offset, and highspeed CMOS dynamic latched comparator[J]. Analog Integr Circ Sig Process, 2011, 70: 337.

[8]

Murmann B, Nikaeen P, Connelly D J. Impact of scaling on analog performance and associated modeling needs[J]. IEEE Trans Electron Devices, 2006, 53: 2160. doi: 10.1109/TED.2006.880372

[9]

Lin T, Wang M S, Gu W R. A wide-range and high-precision real-time calibration for dynamic comparator[J]. IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2012: 1.

[10]

Sumanen L, Waltari M, Halonen K. A mismatch insensitive CMOS dynamic comparator for pipeline A/D converters[J]. IEEE International Conference on Electronics, Circuits and Systems (IECS), 2000, 1: 32.

[11]

Cho T B, Gray P R. A 10 b, 20 Msample/s, 35 mW pipeline A/D converter[J]. IEEE J Solid-State Circuits, 1995, SC-30: 166.

[12]

Johns D, Martin K. Analog integrated circuit design. New York: Wiley, 2000

[13]

Wicht B, Nirschl T, Schmitt-Landsiedel D. Yield and speed optimization of a latch-type voltage sense amplifier[J]. IEEE J Solid-State Circuits, 2004, 39: 1148. doi: 10.1109/JSSC.2004.829399

[14]

He J, Zhan S, Chen D. Analyses of static and dynamic random offset voltages in dynamic comparators[J]. IEEE International Symposium on Circuits and Systems, 2009, 56: 911.

[15]

Nikoozadeh A, Murmann B. An analysis of latch comparator offset due to load capacitor mismatch[J]. IEEE Trans Circuits Syst Ⅱ:Express Briefs, 2006, 53: 1398. doi: 10.1109/TCSII.2006.883204

[16]

Bichan M, Carusone A C. The effect of redundancy on mismatch-induced offset and random noise in a dynamic comparator[J]. Research in Microelectronics and Electronics, 2009: 180.

[17]

Kinget P R. Device mismatch and tradeoffs in the design of analog circuits[J]. IEEE J Solid-State Circuits, 2005, 40: 1212. doi: 10.1109/JSSC.2005.848021

[18]

Savengsveksa V, Heedley P L, Matthews T. An 8-b 20 Msample/s pipelined A/D converter in 0.5μm CMOS with 7.8 ENOB[J]. IEEE MWSCAS, 2005: 409.

[19]

Kim J, Leibowitz B, Ren J. Simulation and analysis of random decision errors in clocked comparators[J]. IEEE Trans Circuits Syst I, Reg Papers, 2009, 56: 1844. doi: 10.1109/TCSI.2009.2028449

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S B Liu, Z M Zhu, Y T Yang, L X Liu. A high speed low power low offset dynamic comparator used in SHA-less pipelined ADC[J]. J. Semicond., 2014, 35(5): 055008. doi: 10.1088/1674-4926/35/5/055008.

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Manuscript received: 02 October 2013 Manuscript revised: 20 November 2013 Online: Published: 01 May 2014

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