1 |
Reactive facet of carbon nitride single crystals
Kong Liu
Journal of Semiconductors, 2020, 41(9): 090202. doi: 10.1088/1674-4926/41/9/090202
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2 |
Hydride vapor phase epitaxy for gallium nitride substrate
Jun Hu, Hongyuan Wei, Shaoyan Yang, Chengming Li, Huijie Li, et al.
Journal of Semiconductors, 2019, 40(10): 101801. doi: 10.1088/1674-4926/40/10/101801
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3 |
Photoluminescence and structural analysis of wurtzite (ZnO)1−x(V2O5)x composite
Amjid Iqbal, Arshad Mahmood, Q. Raza, A. Shah, Rashad Rashid, et al.
Journal of Semiconductors, 2018, 39(8): 082002. doi: 10.1088/1674-4926/39/8/082002
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4 |
Electrical transport and current properties of rare-earth dysprosium Schottky electrode on p-type GaN at various annealing temperatures
G. Nagaraju, K. Ravindranatha Reddy, V. Rajagopal Reddy
Journal of Semiconductors, 2017, 38(11): 114001. doi: 10.1088/1674-4926/38/11/114001
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5 |
Advances and prospects in visible light communications
Hongda Chen, Chunhui Wu, Honglei Li, Xiongbin Chen, Zongyu Gao, et al.
Journal of Semiconductors, 2016, 37(1): 011001. doi: 10.1088/1674-4926/37/1/011001
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6 |
Junction-temperature estimation in AlGaInP light-emitting diodes using the luminescence spectra method
Jing Wen, Yumei Wen, Ping Li, Sanshan Wang
Journal of Semiconductors, 2016, 37(6): 064010. doi: 10.1088/1674-4926/37/6/064010
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7 |
Synthesis and electroluminescence characterization of a new aluminum complex,[8-hydroxyquinoline] bis[2, 2'bipyridine] aluminum Al(Bpy)2q
Rahul Kumar, Ritu Srivastava, Punita Singh
Journal of Semiconductors, 2016, 37(1): 013001. doi: 10.1088/1674-4926/37/1/013001
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8 |
Synthesis and electroluminescence properties of tris-[5-choloro-8-hydroxyquinoline] aluminum Al(5-Clq)3
Rahul Kumar, Parag Bhargava, Ritu Srivastava, Priyanka Tyagi
Journal of Semiconductors, 2015, 36(6): 064001. doi: 10.1088/1674-4926/36/6/064001
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9 |
Preparation of rare-earth element doped Mg2Si by FAPAS
Wang Liqi, Meng Qingsen, Fan Wenhao
Journal of Semiconductors, 2012, 33(11): 113004. doi: 10.1088/1674-4926/33/11/113004
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10 |
Improved light extraction of wafer-bonded AlGaInP LEDs by surface roughening
Liu Zike, Gao Wei, Xu Chen, Zou Desu, Qin Yuan, et al.
Journal of Semiconductors, 2010, 31(11): 114011. doi: 10.1088/1674-4926/31/11/114011
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11 |
Room-temperature electroluminescence of p-ZnxMg1-xO:Na/n-ZnO p-n junction light emitting diode
Ye Zhizhen, Zhang Liqiang, Huang Jingyun, Zhang Yinzhu, Zhu Liping, et al.
Journal of Semiconductors, 2009, 30(8): 081001. doi: 10.1088/1674-4926/30/8/081001
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12 |
Visible photoluminescence of porous silicon covered with an HfON dielectric layer
Jiang Ran, Zhang Yan
Journal of Semiconductors, 2009, 30(8): 082003. doi: 10.1088/1674-4926/30/8/082003
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13 |
Luminescence spectroscopy of ion implanted AlN bulk single crystal
Li Weiwei, Zhao Youwen, Dong Zhiyuan, Yang Jun, Hu Weijie, et al.
Journal of Semiconductors, 2009, 30(8): 083002. doi: 10.1088/1674-4926/30/8/083002
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14 |
Improving the Luminescence Efficiency of Power White LEDs with Slurry
Li Junfei, Rao Haibo, Hou Bin, Hu Yue, Shen Fahua, et al.
Journal of Semiconductors, 2008, 29(5): 984-987.
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15 |
Electron Injection Enhancement by Diamond-Like Carbon Film in Polymer Electroluminescence Devices
Li Hongjian, Yan Lingling, Huang Baiyun, Yi Danqing, Hu Jin, et al.
Chinese Journal of Semiconductors , 2006, 27(1): 30-34.
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16 |
Resonant Raman Scattering and Photoluminescence Emissions from Above Bandgap Levels in Dilute GaAsN Alloys
Tan P H, Luo X D, Ge W K, Xu Z Y, Zhang Y, et al.
Chinese Journal of Semiconductors , 2006, 27(3): 397-402.
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17 |
Nonlinear Current-Voltage Characteristics and Electroluminescence of cBN Crystal
Dou Qingping, Chen Zhanguo, Jia Gang, Ma Haitao, Cao Kun, et al.
Chinese Journal of Semiconductors , 2006, 27(4): 609-612.
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18 |
Effect of Lattice Mismatch on Luminescence of ZnO/Si Hetero-Structure
Fu Zhuxi, Sun Xiankai, Zhu Junjie, Lin Bixia
Chinese Journal of Semiconductors , 2006, 27(2): 239-244.
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19 |
A High Performance Sub-100nm Nitride/Oxynitride Stack Gate Dielectric CMOS Device with Refractory W/TiN Metal Gates
Zhong Xinghua, Zhou Huajie, Lin Gang, Xu Qiuxia
Chinese Journal of Semiconductors , 2006, 27(3): 448-453.
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20 |
Measurements of Carrier Confinement at β-FeSi2-Si Heterojunction by Electroluminescence
Li Cheng, T. Suemas, F. Hasegawa
Chinese Journal of Semiconductors , 2005, 26(2): 230-233.
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