| Citation: |
Liang Bin, Chen Shuming, Liu Biwei. Temperature Dependence of Digital Single Event Transient[J]. Journal of Semiconductors, 2008, 29(7): 1407-1411.
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Liang B, Chen S M, Liu B W. Temperature Dependence of Digital Single Event Transient[J]. J. Semicond., 2008, 29(7): 1407.
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Temperature Dependence of Digital Single Event Transient
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Abstract
Using mixed-mode simulation,the temperature dependence of digital single event transient (DSET)in an inverter chain has been studied.It was found that the temperature dependence of DSET is much more serious than that of SEU.When the temperature rises from -55 to 125℃,the width of DSET increases about 58.8%.-
Keywords:
- mixed-mode simulation,
- DSET,
- very deep sub-micron,
- radiation
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References
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Proportional views
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