Chin. J. Semicond. > 2003, Volume 24 > Issue S1 > 170-174
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Fabrication and characteristics of metal particle modulated carbon Nanotube Field-effect and single Electron transistors

Peng Lianmao, Chen Ging, Liang Xuelei, Che Renchao, Xia Yang, Xue Zengguan and Wu Quande

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Abstract: Metal particle modulated car on nanotu e devices are fa ricated Using the conventional lithography and nanotechnologies, and their field effect and single electron characteristics are measured for varying temperatures.

Key words: nanoelectronics

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    Received: 16 March 2016 Revised: Online: Published: 01 January 2003

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      Article Navigation >  Journal of Semiconductors  > 2003  >  24(S1): 170-174
      Peng Lianmao, Chen Ging, Liang Xuelei, Che Renchao, Xia Yang, Xue Zengguan, Wu Quande. Fabrication and characteristics of metal particle modulated carbon Nanotube Field-effect and single Electron transistors[J]. Journal of Semiconductors, 2003, 24(S1): 170-174. ****Peng L M, C G, Liang X L, Che R C, Xia Y, Xue Z G, Wu Quande. Fabrication and characteristics of metal particle modulated carbon Nanotube Field-effect and single Electron transistors[J]. Chin. J. Semicond., 2003, 24(S1): 170.
      Citation:
      Peng Lianmao, Chen Ging, Liang Xuelei, Che Renchao, Xia Yang, Xue Zengguan, Wu Quande. Fabrication and characteristics of metal particle modulated carbon Nanotube Field-effect and single Electron transistors[J]. Journal of Semiconductors, 2003, 24(S1): 170-174. ****
      Peng L M, C G, Liang X L, Che R C, Xia Y, Xue Z G, Wu Quande. Fabrication and characteristics of metal particle modulated carbon Nanotube Field-effect and single Electron transistors[J]. Chin. J. Semicond., 2003, 24(S1): 170.
      shu

      Fabrication and characteristics of metal particle modulated carbon Nanotube Field-effect and single Electron transistors

      • Department of Electronics, Peking University, Beijing 100871, China,Department of Electronics, Peking University, Beijing 100871, China,Beijing Laboratory of Electron Microscopy, Institute of Physics, The Chinese Acasemy of Sciences, Beijing 100080, China,Beijing Laboratory of Electron Microscopy, Institute of Physics, The Chinese Acasemy of Sciences, Beijing 100080, China,Center of Microelectlonics, The Chinese Academy of Sciences, Beijing 100029, China,Department of Electronics, Peking University, Beijing 100871, China and Department of Electronics, Peking University, Beijing 100871, China

      • Received Date: 2016-03-16
      • Published Date: 2016-03-15

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