Chin. J. Semicond. > 1993, Volume 14 > Issue 12 > 754-759
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用微波光电导谱仪测量p—n结少子扩散长度

褚幼令 , 王宗欣 and 吴天福

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    Received: 20 August 2015 Revised: Online: Published: 01 December 1993

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      Article Navigation >  Journal of Semiconductors  > 1993  >  14(12): 754-759
      褚幼令, 王宗欣, 吴天福. 用微波光电导谱仪测量p—n结少子扩散长度[J]. 半导体学报(英文版), 1993, 14(12): 754-759.
      Citation:
      褚幼令, 王宗欣, 吴天福. 用微波光电导谱仪测量p—n结少子扩散长度[J]. 半导体学报(英文版), 1993, 14(12): 754-759.
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      • Received Date: 2015-08-20

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