Chin. J. Semicond. > 1992, Volume 13 > Issue 4 > 225-231
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不同介质膜的InP MIS结构界面陷阱的研究

卢励吾 , 周洁 , 瞿伟 and 张盛廉

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    Received: 19 August 2015 Revised: Online: Published: 01 April 1992

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      Article Navigation >  Journal of Semiconductors  > 1992  >  13(4): 225-231
      卢励吾, 周洁, 瞿伟, 张盛廉. 不同介质膜的InP MIS结构界面陷阱的研究[J]. 半导体学报(英文版), 1992, 13(4): 225-231.
      Citation:
      卢励吾, 周洁, 瞿伟, 张盛廉. 不同介质膜的InP MIS结构界面陷阱的研究[J]. 半导体学报(英文版), 1992, 13(4): 225-231.
      shu

      • Received Date: 2015-08-19

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