Chin. J. Semicond. > 2001, Volume 22 > Issue 9 > 1143-1146
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粗糙界面对超薄栅MOS结构的直接隧穿电流的影响

毛凌锋 , 谭长华 , 许铭真 , 卫建林 , 穆甫臣 and 张贺秋

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Key words: 粗糙度, 直接隧穿, 场效应晶体管

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    Received: 20 August 2015 Revised: Online: Published: 01 September 2001

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      Article Navigation >  Journal of Semiconductors  > 2001  >  22(9): 1143-1146
      毛凌锋, 谭长华, 许铭真, 卫建林, 穆甫臣, 张贺秋. 粗糙界面对超薄栅MOS结构的直接隧穿电流的影响[J]. 半导体学报(英文版), 2001, 22(9): 1143-1146.
      Citation:
      毛凌锋, 谭长华, 许铭真, 卫建林, 穆甫臣, 张贺秋. 粗糙界面对超薄栅MOS结构的直接隧穿电流的影响[J]. 半导体学报(英文版), 2001, 22(9): 1143-1146.
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      • Received Date: 2015-08-20

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