| Citation: |
Wang Kaijian, Li Guoliang, Zhang Jun, Wang Jing. Failure Analysis of Electronic Devices[J]. Journal of Semiconductors, 2006, 27(S1): 295-298.
****
Wang K J, Li G L, Zhang J, Wang J. Failure Analysis of Electronic Devices[J]. Chin. J. Semicond., 2006, 27(13): 295.
|
Failure Analysis of Electronic Devices
-
Abstract
In order to study the relation of crystal structure of material to performance of device and to improve performance of device,we analyze failure phenomena of the pin of electronic devices with poor weld ability by microscope and electronic probe.-
Keywords:
- electron,
- components,
- failure,
- examines
-
References
-
Proportional views
DownLoad: