Chin. J. Semicond. > 1982, Volume 3 > Issue 2 > 147-150
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微波无损伤法测半导体材料电阻率

王宗欣 , 赵惠芬 and 胡鸣华

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    Received: 20 August 2015 Revised: Online: Published: 01 February 1982

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      Article Navigation >  Journal of Semiconductors  > 1982  >  3(2): 147-150
      王宗欣, 赵惠芬, 胡鸣华. 微波无损伤法测半导体材料电阻率[J]. 半导体学报(英文版), 1982, 3(2): 147-150.
      Citation:
      王宗欣, 赵惠芬, 胡鸣华. 微波无损伤法测半导体材料电阻率[J]. 半导体学报(英文版), 1982, 3(2): 147-150.
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      • Received Date: 2015-08-20

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