Chin. J. Semicond. > 1994, Volume 15 > Issue 7 > 439-443

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利用STM观察Si（100）微斜面的表面结构

张兆祥，井藤浩志，市川竹男

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    Received: 18 August 2015 Revised: Online: Published: 01 July 1994

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      Article Navigation >  Journal of Semiconductors  > 1994  >  15(7): 439-443
      张兆祥，井藤浩志，市川竹男. 利用STM观察Si（100）微斜面的表面结构[J]. 半导体学报(英文版), 1994, 15(7): 439-443.
      Citation:
      张兆祥，井藤浩志，市川竹男. 利用STM观察Si（100）微斜面的表面结构[J]. 半导体学报(英文版), 1994, 15(7): 439-443.
      shu

      • Received Date: 2015-08-18

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