1 |
Small-signal model parameter extraction for AlGaN/GaN HEMT
Le Yu, Yingkui Zheng, Sheng Zhang, Lei Pang, Ke Wei, et al.
Journal of Semiconductors, 2016, 37(3): 034003. doi: 10.1088/1674-4926/37/3/034003
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2 |
Small signal modeling of AlGaN/GaN HEMTs with consideration of CPW capacitances
Jiangfeng Du, Peng Xu, Kang Wang, Chenggong Yin, Yang Liu, et al.
Journal of Semiconductors, 2015, 36(3): 034009. doi: 10.1088/1674-4926/36/3/034009
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3 |
Modeling of enclosed-gate layout transistors as ESD protection device based on conformal mapping method
Jia Zhang, Haigang Yang, Jiabin Sun, Le Yu, Yuanfeng Wei, et al.
Journal of Semiconductors, 2014, 35(8): 085001. doi: 10.1088/1674-4926/35/8/085001
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4 |
Analytical modeling and simulation of germanium single gate silicon on insulator TFET
T. S. Arun Samuel, N. B. Balamurugan
Journal of Semiconductors, 2014, 35(3): 034002. doi: 10.1088/1674-4926/35/3/034002
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5 |
Influence of absorber doping in a-SiC:H/a-Si:H/a-SiGe:H solar cells
Muhammad Nawaz, Ashfaq Ahmad
Journal of Semiconductors, 2012, 33(4): 042001. doi: 10.1088/1674-4926/33/4/042001
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6 |
Modeling of subthreshold characteristics for undoped and doped deep nanoscale short channel double-gate MOSFETs
Jin Xiaoshi, Liu Xi, Wu Meile, Chuai Rongyan, Jung-Hee Lee, et al.
Journal of Semiconductors, 2012, 33(12): 124003. doi: 10.1088/1674-4926/33/12/124003
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7 |
RF CMOS modeling: a scalable model of RF-MOSFET with different numbers of fingers
Yu Yuning, Sun Lingling, Liu Jun
Journal of Semiconductors, 2010, 31(11): 114007. doi: 10.1088/1674-4926/31/11/114007
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8 |
Modeling and experimental research on a removal mechanism during chemical mechanical polishing at the molecular scale
An Wei, Zhao Yongwu, Wang Yongguang
Journal of Semiconductors, 2010, 31(11): 116005. doi: 10.1088/1674-4926/31/11/116005
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9 |
Sigma–delta modulator modeling analysis and design
Ge Binjie, Wang Xin'an, Zhang Xing, Feng Xiaoxing, Wang Qingqin, et al.
Journal of Semiconductors, 2010, 31(9): 095003. doi: 10.1088/1674-4926/31/9/095003
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10 |
MEXTRAM model based SiGe HBT large-signal modeling
Han Bo, Li Shoulin, Cheng Jiali, Yin Qiuyan, Gao Jianjun, et al.
Journal of Semiconductors, 2010, 31(10): 104004. doi: 10.1088/1674-4926/31/10/104004
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11 |
Modeling and analysis of single-event transients in charge pumps
Zhao Zhenyu, Li Junfeng, Zhang Minxuan, Li Shaoqing
Journal of Semiconductors, 2009, 30(5): 055006. doi: 10.1088/1674-4926/30/5/055006
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12 |
Improvements to the extraction of an AlGaN/GaN HEMT small-signal model
Pu Yan, Pang Lei, Wang Liang, Chen Xiaojuan, Li Chengzhan, et al.
Journal of Semiconductors, 2009, 30(12): 124003. doi: 10.1088/1674-4926/30/12/124003
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13 |
Small-signal model parameter extraction for microwave SiGe HBTs based on Y- and Z-parameter characterization
Fu Jun
Journal of Semiconductors, 2009, 30(8): 084005. doi: 10.1088/1674-4926/30/8/084005
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14 |
Analysis and Modeling of Broadband CMOS Monolithic Balun up to Millimeter-Wave Frequencies
Xia Jun, Wang Zhigong, Wu Xiushan, Li Wei
Journal of Semiconductors, 2008, 29(3): 467-472.
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15 |
A 22-Element Small-Signal Model of GaN HEMT Devices
Liu Dan, Chen Xiaojuan, Liu Xinyu, Wu Dexin
Chinese Journal of Semiconductors , 2007, 28(9): 1438-1442.
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16 |
Modeling the Effects of Adhesion Force on the Molecular-Scale Removal Mechanism in the Chemical Mechanical Polishing of Wafer
Wang Yongguang, Zhao Yongwu
Chinese Journal of Semiconductors , 2007, 28(12): 2018-2022.
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17 |
A New Small-Signal Modeling and Extraction Method in AlGaN/GaN HEMTs
Lu Jing, Wang Yan, Ma Long, Yu Zhiping
Chinese Journal of Semiconductors , 2007, 28(4): 567-572.
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18 |
RF-CMOS Modeling:Parasitic Analysis for MOST On-Wafer Test Structure
Liu Jun, Sun Lingling, Xu Xiaojun
Chinese Journal of Semiconductors , 2007, 28(2): 246-253.
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19 |
Two-Dimensional Static Numerical Modeling and Simulation of AlGaN/GaN HEMT
Xue Lijun, Xia Yang, Liu Ming, Wang Yan, Shao Xue, et al.
Chinese Journal of Semiconductors , 2006, 27(2): 298-303.
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20 |
Parameter Extraction of a III-V Compound HBT Model
Liu Jun, Sun Lingling
Chinese Journal of Semiconductors , 2006, 27(5): 874-880.
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