Chin. J. Semicond. > 2001, Volume 22 > Issue 4 > 496-499
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模拟器件稳态热场正确性的判断方法

张鸿欣

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Key words: 热分析, 可靠性, 半导体器件

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    Received: 20 August 2015 Revised: Online: Published: 01 April 2001

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      Article Navigation >  Journal of Semiconductors  > 2001  >  22(4): 496-499
      张鸿欣. 模拟器件稳态热场正确性的判断方法[J]. 半导体学报(英文版), 2001, 22(4): 496-499.
      Citation:
      张鸿欣. 模拟器件稳态热场正确性的判断方法[J]. 半导体学报(英文版), 2001, 22(4): 496-499.
      shu

      • Received Date: 2015-08-20

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