Chin. J. Semicond. > 1999, Volume 20 > Issue 12 > 1129-1131
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测量半导体中少子漂移迁移率和扩散长度的新方法

李言谨 and 方家熊

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    Received: 19 August 2015 Revised: Online: Published: 01 December 1999

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      Article Navigation >  Journal of Semiconductors  > 1999  >  20(12): 1129-1131
      李言谨, 方家熊. 测量半导体中少子漂移迁移率和扩散长度的新方法[J]. 半导体学报(英文版), 1999, 20(12): 1129-1131.
      Citation:
      李言谨, 方家熊. 测量半导体中少子漂移迁移率和扩散长度的新方法[J]. 半导体学报(英文版), 1999, 20(12): 1129-1131.
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      • Received Date: 2015-08-19

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