
CONTENTS
Guo Xia, Dong Limin, Qu Hongwei, Da Xiaoli, Du Jinyu, Deng Jun and Shen Guangdi
Abstract: 980nm vertical-cavity surface-emitting-diodes (VCSELs) are fabricated by employing metal organic chemical vapor deposition technique and AlAs/AlGaAs selective wet nitrogen oxidation technique which helps to realize the electrical and optical confinement in the VCSEL devices.The effects of oxidation aperture size on the performance of the VCSEL,such as threshold current and series resistance,are analyzed through fabricating VCSELs with different aperture size at the same time.The minimum threshold current is 0.8mA and the maximum optical output power achieved is about 8mW.
Key words: vertical-cavity surface-emitting-diode, intracavity contact, wet nitrogen oxidation
1 |
Contact etch process optimization for RF process wafer edge yield improvement Zhangli Liu, Bingkui He, Fei Meng, Qiang Bao, Yuhong Sun, et al. Journal of Semiconductors, 2019, 40(12): 122402. doi: 10.1088/1674-4926/40/12/122402 |
2 |
Wet nitrogen oxidation technology and its anisotropy influence on VCSELs Yan He, Xiaoying He, Shuai Hu, Jiale Su, Chong Li, et al. Journal of Semiconductors, 2018, 39(12): 126001. doi: 10.1088/1674-4926/39/12/126001 |
3 |
Laser at 532 nm by intracavity frequency-doubling in BBO Xiandan Yuan, Jinsong Wang, Yongqi Chen, Yulong Wu, Yunfei Qi, et al. Journal of Semiconductors, 2017, 38(6): 064007. doi: 10.1088/1674-4926/38/6/064007 |
4 |
Yiyu Wang, Zhaoyang Peng, Huajun Shen, Chengzhan Li, Jia Wu, et al. Journal of Semiconductors, 2016, 37(2): 026001. doi: 10.1088/1674-4926/37/2/026001 |
5 |
Gao Baohong, Zhu Yadong, Liu Yuling, Wang Shengli, Zhou Qiang, et al. Journal of Semiconductors, 2010, 31(7): 076002. doi: 10.1088/1674-4926/31/7/076002 |
6 |
Guo Wanhong, Lu Quanyong, Liu Junqi, Zhang Wei, Jiang Yuchao, et al. Journal of Semiconductors, 2010, 31(11): 114014. doi: 10.1088/1674-4926/31/11/114014 |
7 |
Ti/WSi/Ni ohmic contact to n-type SiCN Cheng Wenjuan, Qian Yanni, Ma Xueming Journal of Semiconductors, 2010, 31(4): 043003. doi: 10.1088/1674-4926/31/4/043003 |
8 |
First-principle study on anatase TiO2 codoped with nitrogen and ytterbium Gao Pan, Zhang Xuejun, Zhou Wenfang, Wu Jing, Liu Qingju, et al. Journal of Semiconductors, 2010, 31(3): 032001. doi: 10.1088/1674-4926/31/3/032001 |
9 |
NiO removal of Ni/Au Ohmic contact to p-GaN after annealing Lin Mengzhe, CaoQing, YanTingjing, ZhangShuming, ChenLianghui, et al. Journal of Semiconductors, 2009, 30(2): 026001. doi: 10.1088/1674-4926/30/2/026001 |
10 |
Spectrum study of top-emitting organic light-emitting devices with micro-cavity structure Liu Xiang, Wei Fuxiang, Liu Hui Journal of Semiconductors, 2009, 30(4): 044007. doi: 10.1088/1674-4926/30/4/044007 |
11 |
Rule of Oxidation Rate in Vertical Cavity Surface Emitting Lasers Feng Yuan, Zhong Jingchang, Hao Yongqin, Zhao Yingjie, Hou Lifeng, et al. Journal of Semiconductors, 2008, 29(12): 2412-2416. |
12 |
Photonic Crystal Vertical Cavity Surface Emitting and Detecting Photodiodes Song Qian, Xu Xingsheng, Hu Haiyang, Lu Lin, Wang Chunxia, et al. Chinese Journal of Semiconductors , 2007, 28(S1): 509-512. |
13 |
Fabrication and Emission Properties of a n-ZnO/p-GaN Heterojunction Light-Emitting Diode Zhou Xin, Gu Shulin, Zhu Shunming, Ye Jiandong, Liu Wei, et al. Chinese Journal of Semiconductors , 2006, 27(2): 249-253. |
14 |
Yang Wei, Liu Xunchun, Zhu Min, Wang Runmei, Shen Huajun, et al. Chinese Journal of Semiconductors , 2006, 27(5): 765-768. |
15 |
Fabrication and Numerical Simulation of a Micromachined Contact Cantilever RF-MEMS Switch Sun Jianhai, Cui Dafu, Xiao Jiang Chinese Journal of Semiconductors , 2006, 27(2): 309-312. |
16 |
Zhong Xinghua, Zhou Huajie, Lin Gang, Xu Qiuxia Chinese Journal of Semiconductors , 2006, 27(3): 448-453. |
17 |
Lateral Oxidation in Vertical Cavity Surface Emitting Lasers Liu Wenli, Hao Yongqin, Wang Yuxia, Jiang Xiaoguang, Feng Yuan, et al. Chinese Journal of Semiconductors , 2006, 27(8): 1351-1354. |
18 |
Zheng Zhongshan, Liu Zhongli, Zhang Guoqiang, Li Ning, Li Guohua, et al. Chinese Journal of Semiconductors , 2005, 26(5): 862-866. |
19 |
Fabrication of Ultrathin SiO2 Gate Dielectric by Direct Nitrogen Implantation into Silicon Substrate Xu Xiaoyan, Cheng Xingzhi, Huang Ru,and Zhang Xing Chinese Journal of Semiconductors , 2005, 26(2): 266-270. |
20 |
Ultralow Threshold Red Vertical-Cavity Surface-Emitting Lasers Chinese Journal of Semiconductors , 2000, 21(1): 28-32. |
Article views: 3017 Times PDF downloads: 1170 Times Cited by: 0 Times
Received: 19 August 2015 Revised: Online: Published: 01 December 2005
Citation: |
Guo Xia, Dong Limin, Qu Hongwei, Da Xiaoli, Du Jinyu, Deng Jun, Shen Guangdi. Fabrication of 980nm Vertical-Cavity Surface-Emitting-Diodes[J]. Journal of Semiconductors, 2005, 26(S1): 129-131.
****
Guo X, Dong L M, Qu H W, Da X L, Du J Y, Deng J, Shen G D. Fabrication of 980nm Vertical-Cavity Surface-Emitting-Diodes[J]. Chin. J. Semicond., 2005, 26(13): 129.
|
Journal of Semiconductors © 2017 All Rights Reserved 京ICP备05085259号-2