Chin. J. Semicond. > 1993, Volume 14 > Issue 6 > 361-367
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SnO_2/Fe_2O_3多层薄膜界面过渡层的性质及其形成机制研究

马晓翠 , 闫大卫 , 吴军 , 王宗昌 and 邹慧珠

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    Received: 20 August 2015 Revised: Online: Published: 01 June 1993

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      Article Navigation >  Journal of Semiconductors  > 1993  >  14(6): 361-367
      马晓翠, 闫大卫, 吴军, 王宗昌, 邹慧珠. SnO_2/Fe_2O_3多层薄膜界面过渡层的性质及其形成机制研究[J]. 半导体学报(英文版), 1993, 14(6): 361-367.
      Citation:
      马晓翠, 闫大卫, 吴军, 王宗昌, 邹慧珠. SnO_2/Fe_2O_3多层薄膜界面过渡层的性质及其形成机制研究[J]. 半导体学报(英文版), 1993, 14(6): 361-367.
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      • Received Date: 2015-08-20

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