Chin. J. Semicond. > 1987, Volume 8 > Issue 1 > 102-108
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平面型器件欧姆接触的衡量——圆形传输线模型外推法

陈存礼 and 徐世晖

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    Received: 19 August 2015 Revised: Online: Published: 01 January 1987

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      Article Navigation >  Journal of Semiconductors  > 1987  >  8(1): 102-108
      陈存礼, 徐世晖. 平面型器件欧姆接触的衡量——圆形传输线模型外推法[J]. 半导体学报(英文版), 1987, 8(1): 102-108.
      Citation:
      陈存礼, 徐世晖. 平面型器件欧姆接触的衡量——圆形传输线模型外推法[J]. 半导体学报(英文版), 1987, 8(1): 102-108.
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      • Received Date: 2015-08-19

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