Chin. J. Semicond. > 2004, Volume 25 > Issue 5 > 497-501
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SCDI结构快闪存储器件Ⅱ:实验与器件特性(英文)

欧文 and 钱鹤

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Key words: SCDI器件, 快闪存储器, 编程速度, 工艺优化, 关键技术

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    Received: 19 August 2015 Revised: Online: Published: 01 May 2004

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      Article Navigation >  Journal of Semiconductors  > 2004  >  25(5): 497-501
      欧文, 钱鹤. SCDI结构快闪存储器件Ⅱ:实验与器件特性(英文)[J]. 半导体学报(英文版), 2004, 25(5): 497-501.
      Citation:
      欧文, 钱鹤. SCDI结构快闪存储器件Ⅱ:实验与器件特性(英文)[J]. 半导体学报(英文版), 2004, 25(5): 497-501.
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      • Received Date: 2015-08-19

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