Abstract: Through the study of a failure mechanism model--the Arrhenius model--of electronic devices in accelerated testing,it is found that the relation between the rate of degradation of failure sensitive parameters and the negative reciprocal of operating stress follows an exponential rule in accelerated testing.Based on the relationship,a failure-mechanism identification method in accelerated testing is presented.Then a progress-stress accelerated test is constructed in the temperature range of 150～310℃,and the consistent failure-mechanism range proves that the method is feasible.

Key words: accelerated testing, failure mechanism, identification