Chin. J. Semicond. > 1992, Volume 13 > Issue 1 > 62-65

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差值取样谱函数定理及其在研究MOS陷阱弛豫效应方面的应用

许铭真 , 谭长华 and 王阳元

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    Received: 19 August 2015 Revised: Online: Published: 01 January 1992

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      Article Navigation >  Journal of Semiconductors  > 1992  >  13(1): 62-65
      许铭真, 谭长华, 王阳元. 差值取样谱函数定理及其在研究MOS陷阱弛豫效应方面的应用[J]. 半导体学报(英文版), 1992, 13(1): 62-65.
      Citation:
      许铭真, 谭长华, 王阳元. 差值取样谱函数定理及其在研究MOS陷阱弛豫效应方面的应用[J]. 半导体学报(英文版), 1992, 13(1): 62-65.
      shu

      • Received Date: 2015-08-19

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