Chin. J. Semicond. > 1997, Volume 18 > Issue 5 > 350-355
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连续波电光检测法用于检测超薄层异质结外延材料均匀性的研究

苏小元 and 朱祖华

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    Received: 19 August 2015 Revised: Online: Published: 01 May 1997

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      Article Navigation >  Journal of Semiconductors  > 1997  >  18(5): 350-355
      苏小元, 朱祖华. 连续波电光检测法用于检测超薄层异质结外延材料均匀性的研究[J]. 半导体学报(英文版), 1997, 18(5): 350-355.
      Citation:
      苏小元, 朱祖华. 连续波电光检测法用于检测超薄层异质结外延材料均匀性的研究[J]. 半导体学报(英文版), 1997, 18(5): 350-355.
      shu

      • Received Date: 2015-08-19

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