Temperature Dependent Raman Scattering of Phonon Modes and Defect Modes in GaN and p-Type GaN Films

Wang Ruimin and Chen Guangde，Lin J Y，and Jang H X

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Key words: GaN, p-type GaN, Raman scattering, defect modes

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Received: 19 August 2015 Revised: Online: Published: 01 April 2005

Article Navigation > Journal of Semiconductors > 2005 > 26(4): 635-640

Wang Ruimin, Chen Guangde，Lin J Y，and Jang H X. Temperature Dependent Raman Scattering of Phonon Modes and Defect Modes in GaN and p-Type GaN Films[J]. 半导体学报(英文版), 2005, 26(4): 635-640.

Citation:

Wang Ruimin, Chen Guangde，Lin J Y，and Jang H X. Temperature Dependent Raman Scattering of Phonon Modes and Defect Modes in GaN and p-Type GaN Films[J]. 半导体学报(英文版), 2005, 26(4): 635-640.