| Citation: |
Liu Biwei, Chen Shuming, Liang Bin, Liu Zheng. Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology[J]. Journal of Semiconductors, 2008, 29(9): 1819-1822.
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Liu B W, Chen S M, Liang B, Liu Z. Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology[J]. J. Semicond., 2008, 29(9): 1819.
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Coupled SET Pulse Injection in a Circuit Simulator in Ultra-Deep Submicron Technology
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Abstract
Single event transient (SET) pulse injection with independent current source in a circuit simulator will introduce great error.This paper presents a coupled current source method based on a two-dimensional lookup table for SET pulse injection.This method is implemented in open source SPICE code.Results of this method agree with the device/circuit mix-mode simulation,while the time cost is much smaller.This method is integrated with SPICE and experimental data can be introduced in it.It is appropriate for SET error rate analysis of large scale combinational circuits.-
Keywords:
- SET,
- pulse injection,
- radiation effect
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References
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Proportional views
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