Chin. J. Semicond. > 1998, Volume 19 > Issue 2 > 132-137
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用超高速光电采样技术研究半导体微波器件时域特性和频域特性

潘家齐 , 袁树忠 , 吕福云 , 范万德 , 王劲松 and 李献元

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    Received: 20 August 2015 Revised: Online: Published: 01 February 1998

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      Article Navigation >  Journal of Semiconductors  > 1998  >  19(2): 132-137
      潘家齐, 袁树忠, 吕福云, 范万德, 王劲松, 李献元. 用超高速光电采样技术研究半导体微波器件时域特性和频域特性[J]. 半导体学报(英文版), 1998, 19(2): 132-137.
      Citation:
      潘家齐, 袁树忠, 吕福云, 范万德, 王劲松, 李献元. 用超高速光电采样技术研究半导体微波器件时域特性和频域特性[J]. 半导体学报(英文版), 1998, 19(2): 132-137.
      shu

      • Received Date: 2015-08-20

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