Chin. J. Semicond. > 1982, Volume 3 > Issue 2 > 89-94

CONTENTS

用C-V法同时测量半导体中深中心和浅杂质的浓度分布

秦国刚 , 杜永昌 and 张玉峰

+ Author Affiliations

PDF

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2885 Times PDF downloads: 927 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 February 1982

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 1982  >  3(2): 89-94
      秦国刚, 杜永昌, 张玉峰. 用C-V法同时测量半导体中深中心和浅杂质的浓度分布[J]. 半导体学报(英文版), 1982, 3(2): 89-94.
      Citation:
      秦国刚, 杜永昌, 张玉峰. 用C-V法同时测量半导体中深中心和浅杂质的浓度分布[J]. 半导体学报(英文版), 1982, 3(2): 89-94.
      shu

      • Received Date: 2015-08-20

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return