Chin. J. Semicond. > 2000, Volume 21 > Issue 11 > 1060-1063
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New Method for Determining Characteristic Parameters of Normal Distribution

穆甫臣 , 谭长华 and 许铭真

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Key words: Distribution

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    穆甫臣, 谭长华, 许铭真. New Method for Determining Characteristic Parameters of Normal Distribution[J]. 半导体学报(英文版), 2000, 21(11): 1060-1063.
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    Received: 20 August 2015 Revised: Online: Published: 01 November 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(11): 1060-1063
      穆甫臣, 谭长华, 许铭真. New Method for Determining Characteristic Parameters of Normal Distribution[J]. 半导体学报(英文版), 2000, 21(11): 1060-1063.
      Citation:
      穆甫臣, 谭长华, 许铭真. New Method for Determining Characteristic Parameters of Normal Distribution[J]. 半导体学报(英文版), 2000, 21(11): 1060-1063.
      shu

      • Received Date: 2015-08-20

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