Chin. J. Semicond. > 1999, Volume 20 > Issue 8 > 662-666
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InAs量子点的原子力显微镜测试结果分析

龚谦 , 梁基本 , 徐波 , 丁鼎 , 王占国 , 裘晓辉 , 商广义 and 白春礼

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    Received: 20 August 2015 Revised: Online: Published: 01 August 1999

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      Article Navigation >  Journal of Semiconductors  > 1999  >  20(8): 662-666
      龚谦, 梁基本, 徐波, 丁鼎, 王占国, 裘晓辉, 商广义, 白春礼. InAs量子点的原子力显微镜测试结果分析[J]. 半导体学报(英文版), 1999, 20(8): 662-666.
      Citation:
      龚谦, 梁基本, 徐波, 丁鼎, 王占国, 裘晓辉, 商广义, 白春礼. InAs量子点的原子力显微镜测试结果分析[J]. 半导体学报(英文版), 1999, 20(8): 662-666.
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      • Received Date: 2015-08-20

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