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A 2.69 ppm/°C bandgap reference with 42 ppm/V line sensitivity for battery management system

Jing Wang1, Feixiang Zhang1, Zhiyuan He1, Hui Zhang2 and Lin Cheng1,

+ Author Affiliations

 Corresponding author: Lin Cheng, eecheng@ustc.edu.cn

DOI: 10.1088/1674-4926/24120045CSTR: 32376.14.1674-4926.24120045

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Abstract: This paper introduces a high-precision bandgap reference (BGR) designed for battery management systems (BMS), featuring an ultra-low temperature coefficient (TC) and line sensitivity (LS). The BGR employs a current-mode scheme with chopped op-amps and internal clock generators to eliminate op-amp offset. A low dropout regulator (LDO) and a pre-regulator enhance output driving and LS, respectively. Curvature compensation enhances the TC by addressing higher-order nonlinearity. These approaches, effective near room temperature, employs trimming at both 20 and 60 °C. When combined with fixed curvature correction currents, it achieves an ultra-low TC for each chip. Implemented in a CMOS 180 nm process, the BGR occupies 0.548 mm² and operates at 2.5 V with 84 μA current draw from a 5 V supply. An average TC of 2.69 ppm/°C with two-point trimming and 0.81 ppm/°C with multi-point trimming are achieved over the temperature range of −40 to 125 °C. It accommodates a load current of 1 mA and an LS of 42 ppm/V, making it suitable for precise BMS applications.

Key words: bandgap referencehigh precisionchoppingcurvature compensationlow temperature coefficientsmall line sensitivitybattery management systemBMS



[1]
Zhu G Q, Yang Y T, Zhang Q D. A 4.6-ppm/°C high-order curvature compensated bandgap reference for BMIC. IEEE Trans Circuits Syst II Express Briefs, 2019, 66(9), 1492
[2]
Hunter B L, Matthews W E. A ± 3 ppm/°C single-trim switched capacitor bandgap reference for battery monitoring applications. IEEE Trans Circuits Syst I Regul Pap, 2017, 64(4), 777 doi: 10.1109/TCSI.2016.2621725
[3]
Boo J H, Cho K I, Kim H J, et al. A single-trim switched capacitor CMOS bandgap reference with a 3σ inaccuracy of 0.02%, −0.12% for battery-monitoring applications. IEEE J Solid State Circuits, 2021, 56(4), 1197 doi: 10.1109/JSSC.2020.3044165
[4]
Ma Y L, Bai C F, Wang Y, et al. A low noise CMOS bandgap voltage reference using chopper stabilization technique. 2020 IEEE 5th International Conference on Integrated Circuits and Microsystems (ICICM), 2020, 184
[5]
Duan Q, Roh J. A 1.2-V 4.2-ppm/°C High-Order Curvature-Compensated CMOS Bandgap Reference. IEEE Trans Circuits Syst I Regul Pap, 2015, 62(3), 662 doi: 10.1109/TCSI.2014.2374832
[6]
Ge G, Zhang C, Hoogzaad G, et al. A single-trim CMOS bandgap reference with a 3σ inaccuracy of ±0.15% from –40°C to 125°C. 2010 IEEE International Solid-State Circuits Conference - (ISSCC), 2010, 46(11), 2693
[7]
Zhou Z K, Shi Y, Huang Z, et al. A 1.6-V 25-μA 5-ppm/°C curvature-compensated bandgap reference. IEEE Trans Circuits Syst I Regul Pap, 2012, 59(4), 677 doi: 10.1109/TCSI.2011.2169732
[8]
Maderbacher G, Marsili S, Motz M, et al. 5.8 A digitally assisted single-point-calibration CMOS bandgap voltage reference with a 3σ inaccuracy of ±0.08% for fuel-gauge applications. 2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers, 2015, 1
[9]
Sheng Jinggang S J, Chen Zhiliang C Z, Shi Bingxue S B. A 1V supply area effective CMOS Bandgap reference. 2003 5th International Conference on ASIC Proceedings, 2003, 619
[10]
Chen H M, Lee C C, Jheng S H, et al. A sub-1 ppm/°C precision bandgap reference with adjusted-temperature-curvature compensation. IEEE Trans Circuits Syst I Regul Pap, 2017, 64(6), 1308 doi: 10.1109/TCSI.2017.2658186
[11]
Chen K, Petruzzi L, Hulfachor R, et al. A 1.16-V 5.8-to-13.5-ppm/°C curvature-compensated CMOS bandgap reference circuit with a shared offset-cancellation method for internal amplifiers. IEEE J Solid State Circuits, 2021, 56(1), 267 doi: 10.1109/JSSC.2020.3033467
[12]
Meijer G C M, Schmale P C, Van Zalinge K. A new curvature-corrected bandgap reference. IEEE J Solid State Circuits, 1982, 17(6), 1139 doi: 10.1109/JSSC.1982.1051872
[13]
Liu L X, Liao X F, Mu J C. A 3.6 μVrms noise, 3 ppm/°C TC bandgap reference with offset/noise suppression and five-piece linear compensation. IEEE Trans Circuits Syst I Regul Pap, 2019, 66(10), 3786 doi: 10.1109/TCSI.2019.2922652
[14]
Huang S L, Li M D, Li H, et al. A sub-1 ppm/°C bandgap voltage reference with high-order temperature compensation in 0.18-μm CMOS process. IEEE Trans Circuits Syst I Regul Pap, 2022, 69(4), 1408 doi: 10.1109/TCSI.2021.3139908
[15]
Liu N Q, Geiger R L, Chen D G. Sub-ppm/°C bandgap references with natural basis expansion for curvature cancellation. IEEE Trans Circuits Syst I Regul Pap, 2021, 68(9), 3551 doi: 10.1109/TCSI.2021.3096166
[16]
Jiang J Z, Shu W, Chang J S. A 5.6 ppm/°C temperature coefficient, 87-dB PSRR, sub-1-V voltage reference in 65-nm CMOS exploiting the zero-temperature-coefficient point. IEEE J Solid State Circuits, 2017, 52(3), 623 doi: 10.1109/JSSC.2016.2627544
[17]
Zhou Z K, Shi Y, Wang Y, et al. A resistorless high-precision compensated CMOS bandgap voltage reference. IEEE Trans Circuits Syst I Regul Pap, 2019, 66(1), 428 doi: 10.1109/TCSI.2018.2857821
[18]
Wang R C, Lu W G, Zhao M, et al. A sub-1ppm/°C current-mode CMOS bandgap reference with piecewise curvature compensation. IEEE Trans Circuits Syst I Regul Pap, 2018, 65(3), 904 doi: 10.1109/TCSI.2017.2771801
[19]
Ma B, Yu F Q. A novel 1.2–V 4.5-ppm/°C curvature-compensated CMOS bandgap reference. IEEE Trans Circuits Syst I Regul Pap, 2014, 61(4), 1026 doi: 10.1109/TCSI.2013.2286032
[20]
Liao X F, Zhang Y X, Zhang S H, et al. A 3.0 μ vrms, 2.4 ppm/°C BGR with feedback coefficient enhancement and bowl-shaped curvature compensation. IEEE Trans Circuits Syst I Regul Pap, 2024, 71(5), 2424 doi: 10.1109/TCSI.2024.3373788
Fig. 1.  (Color online) The current mode BGR core.

Fig. 2.  (Color online) Error sources contribution and mitigation techniques.

Fig. 3.  (Color online) Input offset of operational amplifiers in current-mode BGR core.

Fig. 4.  (Color online) (a) Monte Carlo results for 10 points under current mirror mismatch conditions; (b) Corresponding results for the 10 points after resistor R1 and R0 trimming.

Fig. 5.  (Color online) Temperature characteristics simulation results for various resistor types.

Fig. 6.  (Color online) Schematic of the chopped op-amp.

Fig. 7.  (Color online) A comparison of the offset wi and w/o chopper in 1,000 Monte Carlo simulations.

Fig. 8.  (Color online) Structure of the curvature compensation.

Fig. 9.  (Color online) Compensation principle of the curvature compensation technique.

Fig. 10.  (Color online) First-order curve with curvature correction. (a) Simulation result. (b) Measurement result.

Fig. 11.  (Color online) Structure of the proposed BGR.

Fig. 12.  (Color online) Chip micrograph.

Fig. 13.  (Color online) (a) Measured VREF versus VDD at T = 25 °C; (b) The worst-case offset drift characteristic of the LDO's error amplifier over temperature from 100-point Monte Carlo simulation.

Fig. 14.  (Color online) (a) Measured first-order temperature curve aligned through two-point trimming at 20 and 60 °C. (b) Distribution of TC of the 38 samples.

Fig. 15.  (Color online) The process of two-point trimming.

Fig. 16.  (Color online) Schematic of two-point trimming using ATE.

Fig. 17.  (Color online) (a) Measured two-point trimmed (fixed curvature correction code) VREF versus temperature of 38 samples. (b) Distribution of TC of the 38 samples.

Fig. 18.  (Color online) (a) Measured multi-point trimmed VREF versus temperature of 20 samples. (b) Distribution of TC of the 20 samples.

Fig. 19.  (Color online) (a) Measured noise. (b) Measured PSRR.

Fig. 20.  (Color online) Transient measurement of start-up and ripple.

Table 1.   Error sources in the proposed current-mode bandgap reference voltage

Type of error Error proportion Design technique
Op-amp offset 82.4% Chopping technique
Mismatch of the current
mirror
7.7% Curvature correction
and trimming
Variation of the BJT 7.3% Curvature correction
Process variation and mismatch of the resistors 2.6% Trimming
DownLoad: CSV

Table 2.   Performance summary and comparison.

This work Ref. [11]
JSSC’21
Ref. [14]
TCAS-Ⅰ’22
Ref. [13]
TCAS-Ⅰ’19
Ref. [16]
JSSC’17
Ref. [6]
TCAS-Ⅰ’24
Process (nm) 180 130 180 350 65 180
BGR Type Current-mode Current-mode Voltage-mode Voltage-mode MOSFET Current-mode
VREF (V) 2.5 1.16 2.14 2.47 0.428 0.6
Current (μA) 84 120 409 94 16.25 69
Temp. Range (°C) −40~125 −40~150 −25~125 −45~125 −40~125 −45~125
Trimming Multi-point Two-point
(20 and 60°C)
No Two-point
(−25 and 100°C)
One-point Two-point
(−40 and 125°C)
Multi-point
TC (ppm/°C) 0.64(min)
0.81(avg)
0.98(max)
0.89(min)
2.69(avg)
5.88(max)
5.78(min)
8.75(avg)
13.5(max)
0.7(min)
1.183(avg)
1.557(max)
0.9(min)
3.0(avg)
7.52(max)
3.2(min)
5.6(avg)
9.8(max)
0.87(min)
2.4(avg)
2.95(max)
LS (ppm/V) 42 300 146 41 1000 30
Max. Load (μA) 1000 NA NA 30 NA NA
Active Area (mm2) 0.548 0.08 0.256 0.0616 0.0104 0.088
Samples 20 38 7 6 10 50 10
DownLoad: CSV
[1]
Zhu G Q, Yang Y T, Zhang Q D. A 4.6-ppm/°C high-order curvature compensated bandgap reference for BMIC. IEEE Trans Circuits Syst II Express Briefs, 2019, 66(9), 1492
[2]
Hunter B L, Matthews W E. A ± 3 ppm/°C single-trim switched capacitor bandgap reference for battery monitoring applications. IEEE Trans Circuits Syst I Regul Pap, 2017, 64(4), 777 doi: 10.1109/TCSI.2016.2621725
[3]
Boo J H, Cho K I, Kim H J, et al. A single-trim switched capacitor CMOS bandgap reference with a 3σ inaccuracy of 0.02%, −0.12% for battery-monitoring applications. IEEE J Solid State Circuits, 2021, 56(4), 1197 doi: 10.1109/JSSC.2020.3044165
[4]
Ma Y L, Bai C F, Wang Y, et al. A low noise CMOS bandgap voltage reference using chopper stabilization technique. 2020 IEEE 5th International Conference on Integrated Circuits and Microsystems (ICICM), 2020, 184
[5]
Duan Q, Roh J. A 1.2-V 4.2-ppm/°C High-Order Curvature-Compensated CMOS Bandgap Reference. IEEE Trans Circuits Syst I Regul Pap, 2015, 62(3), 662 doi: 10.1109/TCSI.2014.2374832
[6]
Ge G, Zhang C, Hoogzaad G, et al. A single-trim CMOS bandgap reference with a 3σ inaccuracy of ±0.15% from –40°C to 125°C. 2010 IEEE International Solid-State Circuits Conference - (ISSCC), 2010, 46(11), 2693
[7]
Zhou Z K, Shi Y, Huang Z, et al. A 1.6-V 25-μA 5-ppm/°C curvature-compensated bandgap reference. IEEE Trans Circuits Syst I Regul Pap, 2012, 59(4), 677 doi: 10.1109/TCSI.2011.2169732
[8]
Maderbacher G, Marsili S, Motz M, et al. 5.8 A digitally assisted single-point-calibration CMOS bandgap voltage reference with a 3σ inaccuracy of ±0.08% for fuel-gauge applications. 2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers, 2015, 1
[9]
Sheng Jinggang S J, Chen Zhiliang C Z, Shi Bingxue S B. A 1V supply area effective CMOS Bandgap reference. 2003 5th International Conference on ASIC Proceedings, 2003, 619
[10]
Chen H M, Lee C C, Jheng S H, et al. A sub-1 ppm/°C precision bandgap reference with adjusted-temperature-curvature compensation. IEEE Trans Circuits Syst I Regul Pap, 2017, 64(6), 1308 doi: 10.1109/TCSI.2017.2658186
[11]
Chen K, Petruzzi L, Hulfachor R, et al. A 1.16-V 5.8-to-13.5-ppm/°C curvature-compensated CMOS bandgap reference circuit with a shared offset-cancellation method for internal amplifiers. IEEE J Solid State Circuits, 2021, 56(1), 267 doi: 10.1109/JSSC.2020.3033467
[12]
Meijer G C M, Schmale P C, Van Zalinge K. A new curvature-corrected bandgap reference. IEEE J Solid State Circuits, 1982, 17(6), 1139 doi: 10.1109/JSSC.1982.1051872
[13]
Liu L X, Liao X F, Mu J C. A 3.6 μVrms noise, 3 ppm/°C TC bandgap reference with offset/noise suppression and five-piece linear compensation. IEEE Trans Circuits Syst I Regul Pap, 2019, 66(10), 3786 doi: 10.1109/TCSI.2019.2922652
[14]
Huang S L, Li M D, Li H, et al. A sub-1 ppm/°C bandgap voltage reference with high-order temperature compensation in 0.18-μm CMOS process. IEEE Trans Circuits Syst I Regul Pap, 2022, 69(4), 1408 doi: 10.1109/TCSI.2021.3139908
[15]
Liu N Q, Geiger R L, Chen D G. Sub-ppm/°C bandgap references with natural basis expansion for curvature cancellation. IEEE Trans Circuits Syst I Regul Pap, 2021, 68(9), 3551 doi: 10.1109/TCSI.2021.3096166
[16]
Jiang J Z, Shu W, Chang J S. A 5.6 ppm/°C temperature coefficient, 87-dB PSRR, sub-1-V voltage reference in 65-nm CMOS exploiting the zero-temperature-coefficient point. IEEE J Solid State Circuits, 2017, 52(3), 623 doi: 10.1109/JSSC.2016.2627544
[17]
Zhou Z K, Shi Y, Wang Y, et al. A resistorless high-precision compensated CMOS bandgap voltage reference. IEEE Trans Circuits Syst I Regul Pap, 2019, 66(1), 428 doi: 10.1109/TCSI.2018.2857821
[18]
Wang R C, Lu W G, Zhao M, et al. A sub-1ppm/°C current-mode CMOS bandgap reference with piecewise curvature compensation. IEEE Trans Circuits Syst I Regul Pap, 2018, 65(3), 904 doi: 10.1109/TCSI.2017.2771801
[19]
Ma B, Yu F Q. A novel 1.2–V 4.5-ppm/°C curvature-compensated CMOS bandgap reference. IEEE Trans Circuits Syst I Regul Pap, 2014, 61(4), 1026 doi: 10.1109/TCSI.2013.2286032
[20]
Liao X F, Zhang Y X, Zhang S H, et al. A 3.0 μ vrms, 2.4 ppm/°C BGR with feedback coefficient enhancement and bowl-shaped curvature compensation. IEEE Trans Circuits Syst I Regul Pap, 2024, 71(5), 2424 doi: 10.1109/TCSI.2024.3373788
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    Received: 31 December 2024 Revised: 25 March 2025 Online: Accepted Manuscript: 30 April 2025

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      Jing Wang, Feixiang Zhang, Zhiyuan He, Hui Zhang, Lin Cheng. A 2.69 ppm/°C bandgap reference with 42 ppm/V line sensitivity for battery management system[J]. Journal of Semiconductors, 2025, In Press. doi: 10.1088/1674-4926/24120045 ****J Wang, F X Zhang, Z Y He, H Zhang, and L Cheng, A 2.69 ppm/°C bandgap reference with 42 ppm/V line sensitivity for battery management system[J]. J. Semicond., 2025, accepted doi: 10.1088/1674-4926/24120045
      Citation:
      Jing Wang, Feixiang Zhang, Zhiyuan He, Hui Zhang, Lin Cheng. A 2.69 ppm/°C bandgap reference with 42 ppm/V line sensitivity for battery management system[J]. Journal of Semiconductors, 2025, In Press. doi: 10.1088/1674-4926/24120045 ****
      J Wang, F X Zhang, Z Y He, H Zhang, and L Cheng, A 2.69 ppm/°C bandgap reference with 42 ppm/V line sensitivity for battery management system[J]. J. Semicond., 2025, accepted doi: 10.1088/1674-4926/24120045

      A 2.69 ppm/°C bandgap reference with 42 ppm/V line sensitivity for battery management system

      DOI: 10.1088/1674-4926/24120045
      CSTR: 32376.14.1674-4926.24120045
      More Information
      • Jing Wang received the B.Eng. degree from Sichuan University, Chengdu, China, in 2011. Then, she received the M. Sc. degree in 2012 and the Ph.D. degree in 2017 from Waseda University, Fukuoka, Japan, respectively. From 2017 to 2019, she was a post doctor in Waseda University, Japan. She is currently an associate researcher at the University of Science and Technology of China. Her research focuses on the design of high-precision, low-power analog front-end (AFE) circuits
      • Lin Cheng received the B.Eng. degree from Hefei University of Technology, Hefei, China, in 2008, the M. Sc. degree from Fudan University, Shanghai, China, in 2011, and the Ph.D. degree from Hong Kong University of Science and Technology (HKUST), Hong Kong, in 2016. In 2018, he joined the School of Microelectronics, University of Science and Technology of China, Hefei, where he is currently a Professor. He was a Post-doctoral Research Associate at the Department of Electronic and Computer Engineering, HKUST, from 2016 to 2018, and was an Intern Analog Design Engineer with Broadcom Limited, San Jose, CA, USA, from 2015 to 2016. His current research interests include power management and mixed-signal integrated circuits and systems, wireless power transfer circuits and systems, switched-inductor power converters, and automotive ICs. Dr. Cheng is serving as a member of the ISSCC Technical Committee and the Chair of the IEEE ICTA 2024 Technical Committee. He was a recipient of the IEEE Solid-State Circuits Society Pre-Doctoral Achievement Award from 2014 to 2015, the Hong Kong Institution of Science 2018 Young Scientist Awards (Honorable Mention), and the Best Design Award from the IEEE ASP-DAC University Design Contest in 2020
      • Corresponding author: eecheng@ustc.edu.cn
      • Received Date: 2024-12-31
      • Revised Date: 2025-03-25
      • Available Online: 2025-04-30

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