| Citation: |
Zhang Lucheng, Xu Xinxiang, Yang Zhuojian, Sun Xiaopu, Xu Hongyun, Liu Haobin, Shen Hui. An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging[J]. Journal of Semiconductors, 2009, 30(7): 076001. doi: 10.1088/1674-4926/30/7/076001
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Zhang L C, Xu X X, Yang Z J, Sun X P, Xu H Y, Liu H B, Shen H. An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging[J]. J. Semicond., 2009, 30(7): 076001. doi: 10.1088/1674-4926/30/7/076001.
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An efficient method for monitoring the shunts in silicon solar cells during fabrication processes with infrared imaging
DOI: 10.1088/1674-4926/30/7/076001
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Abstract
In order to monitor the fabrication process, an infrared imaging system was established to detect the shunted regions in crystalline silicon solar cells. The temperature of the shunted region was obviously higher than that of the non-shunted region when the cell was biased under direct voltage due to the Joule heat effect, and the shunted region could be detected by infrared imaging. The shunts caused by seven different reasons can be identified using metallurgical microscopy, scanning electron microscopy, and energy dispersive X-ray spectroscopy. Approaches for diminishing shunts are presented. The methods are beneficial for the optimization of the cell fabrication processes and the improvement of the cell performances.-
Keywords:
- silicon,
- solar cell,
- shunt,
- infrared imaging
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References
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Proportional views
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