Citation: |
Li Zehong, Ren Min, Zhang Bo, Ma Jun, Hu Tao, Zhang Shuai, Wang Fei, Chen Jian. Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth[J]. Journal of Semiconductors, 2010, 31(8): 084002. doi: 10.1088/1674-4926/31/8/084002
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Li Z H, Ren M, Zhang B, Ma J, Hu T, Zhang S, Wang F, Chen J. Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth[J]. J. Semicond., 2010, 31(8): 084002. doi: 10.1088/1674-4926/31/8/084002.
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Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth
DOI: 10.1088/1674-4926/31/8/084002
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Abstract
Silicon superjunction power MOSFETs were fabricated with deep trench etching and epitaxial growth, based on the process platform of the Shanghai Hua Hong NEC Electronics Company Limited. The breakdown voltages of the fabricated superjunction MOSFETs are above 700 V and agree with the simulation. The dynamic characteristics, especially reverse diode characteristics, are equivalent or even superior to foreign counterparts.-
Keywords:
- superjunction,
- deep trench etching,
- epitaxial growth,
- power MOSFET
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References
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Proportional views