J. Semicond. > 2010, Volume 31 > Issue 8 > 084002

SEMICONDUCTOR DEVICES

Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth

Li Zehong, Ren Min, Zhang Bo, Ma Jun, Hu Tao, Zhang Shuai, Wang Fei and Chen Jian

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DOI: 10.1088/1674-4926/31/8/084002

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Abstract: Silicon superjunction power MOSFETs were fabricated with deep trench etching and epitaxial growth, based on the process platform of the Shanghai Hua Hong NEC Electronics Company Limited. The breakdown voltages of the fabricated superjunction MOSFETs are above 700 V and agree with the simulation. The dynamic characteristics, especially reverse diode characteristics, are equivalent or even superior to foreign counterparts.

Key words: superjunctiondeep trench etchingepitaxial growthpower MOSFET

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    Received: 18 August 2015 Revised: 15 April 2010 Online: Published: 01 August 2010

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      Li Zehong, Ren Min, Zhang Bo, Ma Jun, Hu Tao, Zhang Shuai, Wang Fei, Chen Jian. Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth[J]. Journal of Semiconductors, 2010, 31(8): 084002. doi: 10.1088/1674-4926/31/8/084002 ****Li Z H, Ren M, Zhang B, Ma J, Hu T, Zhang S, Wang F, Chen J. Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth[J]. J. Semicond., 2010, 31(8): 084002. doi: 10.1088/1674-4926/31/8/084002.
      Citation:
      Li Zehong, Ren Min, Zhang Bo, Ma Jun, Hu Tao, Zhang Shuai, Wang Fei, Chen Jian. Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth[J]. Journal of Semiconductors, 2010, 31(8): 084002. doi: 10.1088/1674-4926/31/8/084002 ****
      Li Z H, Ren M, Zhang B, Ma J, Hu T, Zhang S, Wang F, Chen J. Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth[J]. J. Semicond., 2010, 31(8): 084002. doi: 10.1088/1674-4926/31/8/084002.

      Above 700 V superjunction MOSFETs fabricated by deep trench etching and epitaxial growth

      DOI: 10.1088/1674-4926/31/8/084002
      • Received Date: 2015-08-18
      • Accepted Date: 2010-03-23
      • Revised Date: 2010-04-15
      • Published Date: 2010-07-31

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