| Citation: |
Di Xia, Tian Caijuan, Tang Rongzhe, Li Wei, Feng Lianghuan, Zhang Jingquan, Wu Lili, Lei Zhi. Structural and optical properties of Cd0.8Zn0.2S thin films[J]. Journal of Semiconductors, 2011, 32(2): 022003. doi: 10.1088/1674-4926/32/2/022003
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Di X, Tian C J, Tang R Z, Li W, Feng L H, Zhang J Q, Wu L L, Lei Z. Structural and optical properties of Cd0.8Zn0.2S thin films[J]. J. Semicond., 2011, 32(2): 022003. doi: 10.1088/1674-4926/32/2/022003.
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Abstract
Cd1-xZnxS thin films were deposited on glass substrates by a vacuum coevaporation method. The structural, compositional, and optical properties of as-deposited Cd0.8Zn0.2S films were investigated using X-ray diffraction (XRD), X-ray fluorescence (XRF), X-ray photoelectron spectroscopy (XPS), and optical transmittance spectrum. The thin films are hexagonal in structure, with strong preferential orientation along the (002) planes. The composition of Cd1-xZnxS thin films monitored by a quartz crystal oscillator agrees well with that obtained from XRF and XPS measurements. The optical constants, such as refractive index, single-oscillator energy, dispersion energy, absorption coefficients, and the optical band gap, were deduced by the Swanepoel's method, in combination with the Wemple and DiDomenico single-oscillator model, from the transmission spectrum of Cd0.8Zn0.2S thin films.-
Keywords:
- ternary compound,
- thin films,
- coevaporation
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References
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