| Citation: |
Xin Weiping, Zhuang Yiqi, Li Xiaoming. An embeddable SOC real-time prediction technology for TDDB[J]. Journal of Semiconductors, 2012, 33(11): 115009. doi: 10.1088/1674-4926/33/11/115009
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Xin W P, Zhuang Y Q, Li X M. An embeddable SOC real-time prediction technology for TDDB[J]. J. Semicond., 2012, 33(11): 115009. doi: 10.1088/1674-4926/33/11/115009.
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Abstract
This paper presents an embeddable SOC real-time prediction circuit and method for TDDB. When the SOC under test is fails due to TDDB, the prediction circuit is capable of issuing a warning signal. The prediction circuit, designed by using a standard CMOS process, occupies a small silicon area and does not share any signal with the circuits under test, therefore, the possibility of interference with the surrounding circuits is safely excluded.-
Keywords:
- TDDB,
- real-time,
- reliability,
- prediction,
- SOC
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References
[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] -
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