J. Semicond. > 2012, Volume 33 > Issue 6 > 066003

SEMICONDUCTOR TECHNOLOGY

H-plasma-assisted aluminum induced crystallization of amorphous silicon

Li Juan, Liu Ning, Luo Chong, Meng Zhiguo, Xiong Shaozhen and Hoi Sing Kwok

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DOI: 10.1088/1674-4926/33/6/066003

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Abstract: A technique to improve and accelerate aluminum induced crystallization (AIC) by using hydrogen plasma is proposed. Raman spectroscopy and secondary ion mass spectrometry of crystallized poly-Si thin films show that hydrogen plasma radicals reduce the crystallization time of AIC. This technique shortens the annealing time from 10 to 4 h and increases the Hall mobility from 22.1 to 42.5 cm2/(V·S). The possible mechanism of AIC assisted by hydrogen radicals is also discussed.

Key words: poly-silicon

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    Received: 20 August 2015 Revised: 11 January 2012 Online: Published: 01 June 2012

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      Li Juan, Liu Ning, Luo Chong, Meng Zhiguo, Xiong Shaozhen, Hoi Sing Kwok. H-plasma-assisted aluminum induced crystallization of amorphous silicon[J]. Journal of Semiconductors, 2012, 33(6): 066003. doi: 10.1088/1674-4926/33/6/066003 ****Li J, Liu N, Luo C, Meng Z G, Xiong S Z, H S Kwok. H-plasma-assisted aluminum induced crystallization of amorphous silicon[J]. J. Semicond., 2012, 33(6): 066003. doi:  10.1088/1674-4926/33/6/066003.
      Citation:
      Li Juan, Liu Ning, Luo Chong, Meng Zhiguo, Xiong Shaozhen, Hoi Sing Kwok. H-plasma-assisted aluminum induced crystallization of amorphous silicon[J]. Journal of Semiconductors, 2012, 33(6): 066003. doi: 10.1088/1674-4926/33/6/066003 ****
      Li J, Liu N, Luo C, Meng Z G, Xiong S Z, H S Kwok. H-plasma-assisted aluminum induced crystallization of amorphous silicon[J]. J. Semicond., 2012, 33(6): 066003. doi:  10.1088/1674-4926/33/6/066003.

      H-plasma-assisted aluminum induced crystallization of amorphous silicon

      DOI: 10.1088/1674-4926/33/6/066003
      Funds:

      The National Natural Science Foundation of China (General Program, Key Program, Major Research Plan)

      • Received Date: 2015-08-20
      • Accepted Date: 2011-11-18
      • Revised Date: 2012-01-11
      • Published Date: 2012-05-22

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