J. Semicond. > 2012, Volume 33 > Issue 8 > 085007

SEMICONDUCTOR INTEGRATED CIRCUITS

Diagnosis of soft faults in analog integrated circuits based on fractional correlation

Deng Yong, Shi Yibing and Zhang Wei

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DOI: 10.1088/1674-4926/33/8/085007

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Abstract: Aiming at the problem of diagnosing soft faults in analog integrated circuits, an approach based on fractional correlation is proposed. First, the Volterra series of the circuit under test (CUT) decomposed by the fractional wavelet packet are used to calculate the fractional correlation functions. Then, the calculated fractional correlation functions are used to form the fault signatures of the CUT. By comparing the fault signatures, the different soft faulty conditions of the CUT are identified and the faults are located. Simulations of benchmark circuits illustrate the proposed method and validate its effectiveness in diagnosing soft faults in analog integrated circuits.

Key words: analog circuits

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    Received: 20 August 2015 Revised: 28 October 2011 Online: Published: 01 August 2012

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      Deng Yong, Shi Yibing, Zhang Wei. Diagnosis of soft faults in analog integrated circuits based on fractional correlation[J]. Journal of Semiconductors, 2012, 33(8): 085007. doi: 10.1088/1674-4926/33/8/085007 ****Deng Y, Shi Y B, Zhang W. Diagnosis of soft faults in analog integrated circuits based on fractional correlation[J]. J. Semicond., 2012, 33(8): 085007. doi: 10.1088/1674-4926/33/8/085007.
      Citation:
      Deng Yong, Shi Yibing, Zhang Wei. Diagnosis of soft faults in analog integrated circuits based on fractional correlation[J]. Journal of Semiconductors, 2012, 33(8): 085007. doi: 10.1088/1674-4926/33/8/085007 ****
      Deng Y, Shi Y B, Zhang W. Diagnosis of soft faults in analog integrated circuits based on fractional correlation[J]. J. Semicond., 2012, 33(8): 085007. doi: 10.1088/1674-4926/33/8/085007.

      Diagnosis of soft faults in analog integrated circuits based on fractional correlation

      DOI: 10.1088/1674-4926/33/8/085007
      Funds:

      New Century Excellent Talents in University (NCET-05-0804)

      Chinese National Programs for High Technology Research and Development(2006AA06Z222)

      • Received Date: 2015-08-20
      • Accepted Date: 2011-08-25
      • Revised Date: 2011-10-28
      • Published Date: 2012-07-27

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