J. Semicond. > 2019, Volume 40 > Issue 6 > 060203
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Topological photodetection

Zhongming Wei

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DOI: 10.1088/1674-4926/40/6/060203

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    Received: Revised: Online: Published: 05 June 2019

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      Article Navigation >  Journal of Semiconductors  > 2019  >  40(6): 060203
      Zhongming Wei. Topological photodetection[J]. Journal of Semiconductors, 2019, 40(6): 060203. doi: 10.1088/1674-4926/40/6/060203 ****M Z WEi, Topological photodetection[J]. J. Semicond., 2019, 40(6): 060201. doi: 10.1088/1674-4926/40/6/060203.
      Citation:
      Zhongming Wei. Topological photodetection[J]. Journal of Semiconductors, 2019, 40(6): 060203. doi: 10.1088/1674-4926/40/6/060203 ****
      M Z WEi, Topological photodetection[J]. J. Semicond., 2019, 40(6): 060201. doi: 10.1088/1674-4926/40/6/060203.
      shu

      Topological photodetection

      DOI: 10.1088/1674-4926/40/6/060203

      • Zhongming Wei (Institute of Semiconductors, CAS, Beijing, China)

      • Published Date: 2019-06-01

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