Citation: |
Dandan Ning, Yanan Chen, Xinkun Li, Dechun Liang, Shufang Ma, Peng Jin, Zhanguo Wang. Research on the photoluminescence of spectral broadening by rapid thermal annealing on InAs/GaAs quantum dots[J]. Journal of Semiconductors, 2020, 41(12): 122101. doi: 10.1088/1674-4926/41/12/122101
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D D Ning, Y N Chen, X K Li, D C Liang, S F Ma, P Jin, Z G Wang, Research on the photoluminescence of spectral broadening by rapid thermal annealing on InAs/GaAs quantum dots[J]. J. Semicond., 2020, 41(12): 122101. doi: 10.1088/1674-4926/41/12/122101.
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Research on the photoluminescence of spectral broadening by rapid thermal annealing on InAs/GaAs quantum dots
DOI: 10.1088/1674-4926/41/12/122101
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Abstract
Photoluminescence (PL) test was conducted to investigate the effect of rapid thermal annealing (RTA) on the optical performance of self-assembled InAs/GaAs quantum dots (QDs) at the temperatures of 16 and 300 K. It was found that after RTA treatment, the PL spectrum of the QDs sample had a large blue-shift and significantly broadened at 300 K. Compared with the as-grown InAs QDs sample, the PL spectral width has increased by 44.68 meV in the InAs QDs sample RTA-treated at 800 °C. The excitation power-dependent PL measurements showed that the broadening of the PL peaks of the RTA-treated InAs QDs should be related to the emission of the ground state (GS) of different-sized InAs QDs, the InAs wetting layer (WL) and the In0.15Ga0.85As strain reduction layer (SRL) in the epitaxial InAs/GaAs layers. -
References
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