Chin. J. Semicond. > 1980, Volume 1 > Issue 1 > 43-45
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GaAs-AlGaAs双异质结(DH)外延片的位错检测

彭怀德

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    Received: 20 August 2015 Revised: Online: Published: 01 January 1980

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      Article Navigation >  Journal of Semiconductors  > 1980  >  1(1): 43-45
      彭怀德. GaAs-AlGaAs双异质结(DH)外延片的位错检测[J]. 半导体学报(英文版), 1980, 1(1): 43-45.
      Citation:
      彭怀德. GaAs-AlGaAs双异质结(DH)外延片的位错检测[J]. 半导体学报(英文版), 1980, 1(1): 43-45.
      shu

      • Received Date: 2015-08-20

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