Chin. J. Semicond. > 1981, Volume 2 > Issue 2 > 141-152
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Si开关晶体管电荷存贮效应的模拟

夏武颖

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    Received: 20 August 2015 Revised: Online: Published: 01 February 1981

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      Article Navigation >  Journal of Semiconductors  > 1981  >  2(2): 141-152
      夏武颖. Si开关晶体管电荷存贮效应的模拟[J]. 半导体学报(英文版), 1981, 2(2): 141-152.
      Citation:
      夏武颖. Si开关晶体管电荷存贮效应的模拟[J]. 半导体学报(英文版), 1981, 2(2): 141-152.
      shu

      • Received Date: 2015-08-20

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