Chin. J. Semicond. > 2005, Volume 26 > Issue 8 > 1646-1652
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DES密码电路的抗差分功耗分析设计

韩军 , 曾晓洋 and 汤庭鳌

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Key words: 差分功耗分析, 互补结构, 抗攻击电路, DES

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    Received: 18 August 2015 Revised: Online: Published: 01 August 2005

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      Article Navigation >  Journal of Semiconductors  > 2005  >  26(8): 1646-1652
      韩军, 曾晓洋, 汤庭鳌. DES密码电路的抗差分功耗分析设计[J]. 半导体学报(英文版), 2005, 26(8): 1646-1652.
      Citation:
      韩军, 曾晓洋, 汤庭鳌. DES密码电路的抗差分功耗分析设计[J]. 半导体学报(英文版), 2005, 26(8): 1646-1652.
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      • Received Date: 2015-08-18

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