Chin. J. Semicond. > 1983, Volume 4 > Issue 2 > 194-196
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用光吸收法测量半绝缘GaAs中Cr浓度的定标曲线

许振嘉 , 张泽华 and 孙伯康

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    Received: 20 August 2015 Revised: Online: Published: 01 February 1983

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      Article Navigation >  Journal of Semiconductors  > 1983  >  4(2): 194-196
      许振嘉, 张泽华, 孙伯康. 用光吸收法测量半绝缘GaAs中Cr浓度的定标曲线[J]. 半导体学报(英文版), 1983, 4(2): 194-196.
      Citation:
      许振嘉, 张泽华, 孙伯康. 用光吸收法测量半绝缘GaAs中Cr浓度的定标曲线[J]. 半导体学报(英文版), 1983, 4(2): 194-196.
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      • Received Date: 2015-08-20

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