A Second Single-Probe Traversal Optimization for MCM Substrate

Xu Ruqing; Dong Gang; Huang Weiwei; Yang Yintang

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Article Navigation > Journal of Semiconductors > 2007 > 28(10): 1652-1655

Xu Ruqing, Dong Gang, Huang Weiwei, Yang Yintang. A Second Single-Probe Traversal Optimization for MCM Substrate[J]. Journal of Semiconductors, 2007, 28(10): 1652-1655. ****Xu R Q, Dong G, Huang W W, Yang Y T. A Second Single-Probe Traversal Optimization for MCM Substrate[J]. Chin. J. Semicond., 2007, 28(10): 1652.

Citation:

Xu Ruqing, Dong Gang, Huang Weiwei, Yang Yintang. A Second Single-Probe Traversal Optimization for MCM Substrate[J]. Journal of Semiconductors, 2007, 28(10): 1652-1655. ****

Xu R Q, Dong G, Huang W W, Yang Y T. A Second Single-Probe Traversal Optimization for MCM Substrate[J]. Chin. J. Semicond., 2007, 28(10): 1652.

Citation:

Xu Ruqing, Dong Gang, Huang Weiwei, Yang Yintang. A Second Single-Probe Traversal Optimization for MCM Substrate[J]. Journal of Semiconductors, 2007, 28(10): 1652-1655. ****

Xu R Q, Dong G, Huang W W, Yang Y T. A Second Single-Probe Traversal Optimization for MCM Substrate[J]. Chin. J. Semicond., 2007, 28(10): 1652.

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A Second Single-Probe Traversal Optimization for MCM Substrate

Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,Microelectronics Institute,Xidian University,Xi'an 710071,China
Department of Advanced Research,CETC,Beijing 100846,China
Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,Microelectronics Institute,Xidian University,Xi'an 710071,China
Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,Microelectronics Institute,Xidian University,Xi'an 710071,China
Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,Microelectronics Institute,Xidian University,Xi'an 710071,China

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国家自然科学基金(60606006)

Received Date: 2015-08-18
Accepted Date: 2007-03-23
Revised Date: 2007-05-21
Published Date: 2007-09-26

Abstract

Abstract

For the single-probe technology used to test MCM substrate,this paper presents a second single-probe traversal optimization approach based on a simulated annealing algorithm. Compared with previous heuristic algorithms,significant improvements are achieved using the proposed algorithm,and test cost is reduced dramatically by 90.2%.
- single probe test,
- simulated annealing algorithm,
- second optimization

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