1 |
Hot electron effects on the operation of potential well barrier diodes
M. Akura, G. Dunn, M. Missous
Journal of Semiconductors, 2019, 40(12): 122101. doi: 10.1088/1674-4926/40/12/122101
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2 |
Hybrid functional microfibers for textile electronics and biosensors
Bichitra Nanda Sahoo, Byungwoo Choi, Jungmok Seo, Taeyoon Lee
Journal of Semiconductors, 2018, 39(1): 011009. doi: 10.1088/1674-4926/39/1/011009
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3 |
Engineering in-plane silicon nanowire springs for highly stretchable electronics
Zhaoguo Xue, Taige Dong, Zhimin Zhu, Yaolong Zhao, Ying Sun, et al.
Journal of Semiconductors, 2018, 39(1): 011001. doi: 10.1088/1674-4926/39/1/011001
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4 |
Materials and applications of bioresorbable electronics
Xian Huang
Journal of Semiconductors, 2018, 39(1): 011003. doi: 10.1088/1674-4926/39/1/011003
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5 |
The effects of drain scatterings on the electron transport properties of strained-Si diodes with ballistic and non-ballistic channels
Yasenjan Ghupur, Mamtimin Geni, Mamatrishat Mamat, Abudukelimu Abudureheman
Journal of Semiconductors, 2015, 36(4): 044004. doi: 10.1088/1674-4926/36/4/044004
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6 |
Effects of defects on the electronic properties of WTe2 armchair nanoribbons
Bahniman Ghosh, Abhishek Gupta, Bhupesh Bishnoi
Journal of Semiconductors, 2014, 35(11): 113002. doi: 10.1088/1674-4926/35/11/113002
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7 |
In situ TEM/SEM electronic/mechanical characterization of nano material with MEMS chip
Yuelin Wang, Tie Li, Xiao Zhang, Hongjiang Zeng, Qinhua Jin, et al.
Journal of Semiconductors, 2014, 35(8): 081001. doi: 10.1088/1674-4926/35/8/081001
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8 |
Structural parameters improvement of an integrated HBT in a cascode configuration opto-electronic mixer
Hassan Kaatuzian, Hadi Dehghan Nayeri, Masoud Ataei, Ashkan Zandi
Journal of Semiconductors, 2013, 34(9): 094001. doi: 10.1088/1674-4926/34/9/094001
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9 |
AC-electronic and dielectric properties of semiconducting phthalocyanine compounds:a comparative study
Safa'a M. Hraibat, Rushdi M-L. Kitaneh, Mohammad M. Abu-Samreh, Abdelkarim M. Saleh
Journal of Semiconductors, 2013, 34(11): 112001. doi: 10.1088/1674-4926/34/11/112001
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10 |
CuPc/C60 heterojunction thin film optoelectronic devices
Imran Murtaza, Ibrahim Qazi, Khasan S. Karimov
Journal of Semiconductors, 2010, 31(6): 064005. doi: 10.1088/1674-4926/31/6/064005
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11 |
Photoconductive properties of lead iodide films prepared by electron beam evaporation
Zhu Xinghua, Yang Dingyu, Wei Zhaorong, Sun Hui, Wang Zhiguo, et al.
Journal of Semiconductors, 2010, 31(8): 083002. doi: 10.1088/1674-4926/31/8/083002
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12 |
Ternary logic circuit design based on single electron transistors
Wu Gang, Cai Li, Li Qin
Journal of Semiconductors, 2009, 30(2): 025011. doi: 10.1088/1674-4926/30/2/025011
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13 |
Organic Light-Emitting Diodes by Doping Liq into an Electron Transport Layer
Xu Wei, Lu Fuhan, Jiang Xueyin, Zhang Zhilin, Zhu Wenqing, et al.
Journal of Semiconductors, 2008, 29(1): 33-38.
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14 |
Study of NiSi/Si Interface by Cross-Section Transmission Electron Microscopy
Jiang Yulong, Ru Guoping, Qu Xinping, Li Bingzong
Chinese Journal of Semiconductors , 2006, 27(2): 223-228.
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15 |
The Usage of Two Dielectric Function Models
Chen Hong, Shen Wenzhong
Chinese Journal of Semiconductors , 2006, 27(4): 583-590.
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16 |
Electron Injection Enhancement by Diamond-Like Carbon Film in Polymer Electroluminescence Devices
Li Hongjian, Yan Lingling, Huang Baiyun, Yi Danqing, Hu Jin, et al.
Chinese Journal of Semiconductors , 2006, 27(1): 30-34.
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17 |
Quantum and Transport Mobilities of a Two-Dimensional Electron Gas in the Presence of the Rashba Spin-Orbit Interaction
Xu Wen
Chinese Journal of Semiconductors , 2006, 27(2): 204-217.
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18 |
Transport Properties of Two Coupled Quantum Dots Under Optical Pumping
Ge Chuannan, Wen Jun, Peng Ju, Wang Baigeng
Chinese Journal of Semiconductors , 2006, 27(4): 598-603.
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19 |
A New Method to Retrieve Proximity Effect Parameters in Electron-Beam Lithography
Kang Xiaohui, Li Zhigang, Liu Ming, Xie Changqing, and Chen Baoqin, et al.
Chinese Journal of Semiconductors , 2005, 26(3): 455-459.
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20 |
Full Band Monte Carlo Simulation of Electron Transport in Ge with Anisotropic Scattering Process
Chen, Yong, and, Ravaioli, Umberto, et al.
Chinese Journal of Semiconductors , 2005, 26(3): 465-471.
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