Chin. J. Semicond. > 2003, Volume 24 > Issue 8 > 892-896

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Key words: LDD-CMOS, ESD潜在损伤, Snapback

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    Received: 20 August 2015 Revised: Online: Published: 01 August 2003

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      马巍, 郝跃. LDD-CMOS中ESD及其相关机理[J]. 半导体学报(英文版), 2003, 24(8): 892-896.
      Citation:
      马巍, 郝跃. LDD-CMOS中ESD及其相关机理[J]. 半导体学报(英文版), 2003, 24(8): 892-896.

      • Received Date: 2015-08-20

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