Citation: |
W/TiN Gate Thin-Film Fully-Depleted SOI CMOS Devices[J]. Journal of Semiconductors, 2005, 26(1): 6-10.
****
2005: W/TiN Gate Thin-Film Fully-Depleted SOI CMOS Devices. Journal of Semiconductors, 26(1): 6-10.
|
W/TiN Gate Thin-Film Fully-Depleted SOI CMOS Devices
-
Abstract
TiN gate thin-film fully-depleted SOI CMOS devices are fabricated and discussed.Key process technologies are demonstrated.Compared with the dual polysilicon gate devices,the channel doping concentration of nMOS and pMOS can be reduced without changing threshold voltage (VT),which enhances the mobility.Symmetrical VT is achieved by nearly the same VT implant dose because of the near mid-gap workfunction of TiN gate.The SCE effect is improved when the thin-film thickness is reduced. -
References
-
Proportional views