Chin. J. Semicond. > 2003, Volume 24 > Issue 5 > 544-549
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基于关键面积的冗余集成电路成品率分析

赵天绪 , 段旭朝 , 马佩军 and 郝跃

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Key words: 关键面积, 故障, 成品率, 缺陷

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    Received: 20 August 2015 Revised: Online: Published: 01 May 2003

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      Article Navigation >  Journal of Semiconductors  > 2003  >  24(5): 544-549
      赵天绪, 段旭朝, 马佩军, 郝跃. 基于关键面积的冗余集成电路成品率分析[J]. 半导体学报(英文版), 2003, 24(5): 544-549.
      Citation:
      赵天绪, 段旭朝, 马佩军, 郝跃. 基于关键面积的冗余集成电路成品率分析[J]. 半导体学报(英文版), 2003, 24(5): 544-549.
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      • Received Date: 2015-08-20

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