Chin. J. Semicond. > 2003, Volume 24 > Issue 5 > 544-549
|

CONTENTS

基于关键面积的冗余集成电路成品率分析

赵天绪 , 段旭朝 , 马佩军 and 郝跃

+ Author Affiliations

PDF

Key words: 关键面积, 故障, 成品率, 缺陷

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2595 Times PDF downloads: 774 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 May 2003

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2003  >  24(5): 544-549
      赵天绪, 段旭朝, 马佩军, 郝跃. 基于关键面积的冗余集成电路成品率分析[J]. 半导体学报(英文版), 2003, 24(5): 544-549.
      Citation:
      赵天绪, 段旭朝, 马佩军, 郝跃. 基于关键面积的冗余集成电路成品率分析[J]. 半导体学报(英文版), 2003, 24(5): 544-549.
      shu

      • Received Date: 2015-08-20

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return