Chin. J. Semicond. > 1990, Volume 11 > Issue 10 > 751-758
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用微波光电导谱研究半导体薄片的少子扩散长度和表面复合速度

褚幼令 , 王宗欣 , 刘瑞林 and 左文德

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    Received: 19 August 2015 Revised: Online: Published: 01 October 1990

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      Article Navigation >  Journal of Semiconductors  > 1990  >  11(10): 751-758
      褚幼令, 王宗欣, 刘瑞林, 左文德. 用微波光电导谱研究半导体薄片的少子扩散长度和表面复合速度[J]. 半导体学报(英文版), 1990, 11(10): 751-758.
      Citation:
      褚幼令, 王宗欣, 刘瑞林, 左文德. 用微波光电导谱研究半导体薄片的少子扩散长度和表面复合速度[J]. 半导体学报(英文版), 1990, 11(10): 751-758.
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      • Received Date: 2015-08-19

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